Multi-Z Confocal Microscope Illumination Line and Pinhole Array

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Solution Overview

Problem

Conventional confocal microscopy is slow for 3D volumetric imaging due to the need for sequential scanning in the axial dimension, which limits its application in fast imaging of large volumes, such as monitoring neuronal activity in 3D space.

Innovation Solution

The Multi-Z confocal microscope uses an illumination line extending in the Z dimension and a novel detector system with reflecting pinholes or slits to simultaneously image multiple layers, allowing for fast volumetric imaging by splitting the detection signal into multiple signals corresponding to different depths without significant signal loss.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If sequential scanning in the axial dimension is used to achieve 3D volumetric imaging, then optical sectioning and true 3D resolution are obtained, but imaging speed becomes unacceptably slow

Engineering Contradiction:
Improveoptical sectioning capabilityVSAvoidvolumetric imaging speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The detection system is segmented into multiple independent detection channels, each with its own pinhole and detector, allowing simultaneous detection of multiple axial layers. This segmentation enables parallel processing of depth information without compromising optical sectioning capability in each channel.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention transitions from sequential axial scanning to simultaneous multi-layer detection by adding the depth dimension to the detection system. Multiple pinholes are positioned at different axial positions to detect signals from different layers simultaneously, converting a time-sequential process into a spatially-parallel process.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If multiple pinholes are used to detect multiple axial layers simultaneously, then volumetric imaging speed increases, but signal loss occurs at each pinhole

Engineering Contradiction:
Improvevolumetric imaging speedVSAvoidsignal loss
Core Design Contradiction:
ProductivityVSLoss of energy

Solution Approach 1:

Each pinhole-detector channel serves multiple functions: it provides optical sectioning for its specific layer, contributes to the overall volumetric image, and maintains high detection efficiency through optimized pinhole positioning and sizing. The system achieves multi-functionality by making each detection channel independently effective while collectively providing comprehensive 3D coverage.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The pinhole parameters (size, position, shape) are optimized for each detection channel to maximize signal transmission while maintaining optical sectioning. By adjusting these parameters across different channels, the system balances signal loss against the benefit of simultaneous multi-layer detection.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If the illumination beam is focused to a point as in conventional confocal microscopy, then axial resolution is maximized, but only single-layer imaging is achieved

Engineering Contradiction:
Improveaxial resolutionVSAvoidlayer imaging capability
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The single axial focus point is segmented into multiple focal points at different axial positions, with each point served by its own detection channel. This allows the system to maintain high axial resolution at each layer while simultaneously imaging multiple layers.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The illumination system is extended from a single axial focus to multiple axial foci by adding the depth dimension to the illumination pattern. This enables the beam to be focused at multiple axial positions simultaneously, matching the multi-channel detection system.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables ultrafast volumetric imaging at rates comparable to single-frame rates, providing optical sectioning and improved image contrast and signal-to-noise ratio, while being scalable for larger volumes and adjustable resolution, suitable for applications like functional brain imaging.

Implementation Method 1

The illumination or excitation beam can be focused to an illumination line that extends in the Z dimension by weakly focusing the beam by under-filling the back aperture of a microscope objective such that the illumination focus has a small numerical aperture (NA)

Methodology Applied
Scientific EffectOptical focusing: Focusing

Implementation Method 2

The detector system can include two or more reflecting pinholes (e.g., positive or negative reflecting pinholes), that send the conjugate image to a detector, such as a photodiode, avalanche photodiode, photomultiplier tube

Methodology Applied
Scientific EffectOptical reflection: Reflection

Implementation Method 3

the reflecting pinholes are arranged and aligned so as to define probe volumes that fully span the illumination line focused in the Z dimension

Methodology Applied
Scientific EffectOptical imaging: Lens

Data Source

PatentUS11042016B2Multi-Z confocal imaging system
Publication Date: 2021.06.22 TRUSTEES OF BOSTON UNIV
  • US11042016B2 patent drawing
  • US11042016B2 patent drawing
  • US11042016B2 patent drawing

AI summary

A Multi-Z confocal microscopy system can simultaneously record from multiple Z-sections, and thus performs high speed volumetric imaging. An illumination line can be formed by under-filling the illumination beam in the aperture of the microscope objective. The illumination line extends in the Z dimension into the target sample to be imaged and an X-Y scanning mechanism can be used to scan the illumination line over the sample. The detection signal emanating from the scanned sample can be collected through the full numerical aperture of the microscope objective and directed to a detector subsystem. The detector subsystem includes an array of reflecting pinhole detectors and each reflecting pinhole detector is configured to image a volume at a different depth in the sample. This configuration enables reflecting pinhole detector array to image more than one depth volume at the same time.