Muon Imaging Receiver Using Cherenkov Radiation for Density Analysis

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Solution Overview

Problem

Current muon imaging techniques for non-destructive inspection of large geological and engineering structures are hindered by signal interference from accidental coincidences and back-flux, leading to errors and reduced transportability due to increased weight and complexity.

Innovation Solution

An apparatus utilizing Cherenkov radiation with a receiver and multipixel detection chamber to intercept and reconstruct muon flux, eliminating back-flux through directional collimation and energy analysis, allowing for efficient and portable 2D/3D imaging with reduced encumbrances.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If scintillator planes with light detectors are used to detect muons, then muon flux can be intercepted, but signal is affected by accidental coincidences and back-flux from opposite direction

Engineering Contradiction:
Improvesignal accuracyVSAvoidback-flux and accidental coincidences
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent introduces an optical system (lenses, mirrors, or prisms) as an intermediary between the muon detection medium and the photodetectors. This optical system selectively transmits Cherenkov photons from muons traveling in the forward direction while blocking photons from backward-direction muons, thereby eliminating back-flux and accidental coincidences without requiring complex mechanical shielding

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent exploits the directional parameter of Cherenkov radiation by designing an optical system that transmits only photons within a specific angular range corresponding to forward-moving muons. By filtering based on the emission angle parameter of Cherenkov photons, the system achieves directional selectivity and eliminates signals from muons traveling in opposite directions

Inventive Principle:
Principle #35Parameter changes

2Object-affected harmful factors

If multiple scintillator planes with absorbers are inserted to limit back-flux, then non-coherent muon background decreases, but weight of instrument increases considerably

Engineering Contradiction:
Improvenon-coherent muon backgroundVSAvoidinstrument weight
Core Design Contradiction:
Object-affected harmful factorsVSWeight of moving object

Solution Approach 1:

The patent replaces the mechanical solution of using heavy lead and iron absorber planes with an optical system that uses lenses, mirrors, or prisms to achieve directional filtering. This substitution eliminates the need for massive physical barriers while maintaining the ability to reject back-flux, dramatically reducing instrument weight and improving portability

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Reliability

If many detection layers are used to reduce false positives, then background particle rejection improves, but device complexity and resolution time requirements increase

Engineering Contradiction:
Improvefalse positive reductionVSAvoiddetection layers
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent uses an optical system as a mediator that performs background rejection in a single detection layer by selectively transmitting only Cherenkov photons from forward-direction muons. This eliminates the need for multiple stacked detection layers, simplifying the device structure while maintaining high rejection of false positives from background particles

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly reduces errors and transport issues while enabling rapid, reliable, and flexible muon imaging for large structures by using Cherenkov radiation to determine density distribution with high spatial resolution and minimal false positives.

Implementation Method 1

a receiver (3) adapted to intercept a Cherenkov radiation from a muon flux associated with cosmic rays passing through a portion of a body to be inspected

Methodology Applied
Scientific EffectCherenkov radiation: Cherenkov Effect

Implementation Method 2

an optical device (5) provided with at least one receiving surface (6) having reflecting and/or diffractive properties adapted to convey the Cherenkov radiation associated with muons toward said sensor means (4)

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 3

an optical device (5) provided with at least one receiving surface (6) having reflecting and/or diffractive properties

Methodology Applied
Scientific EffectDiffraction: Diffraction

Implementation Method 4

sensor means (4) adapted to detect the amount of photons or Cherenkov radiation associated with the muon flux

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentEP3380875B1Apparatus and method for the non-invasive inspection of solid bodies via muon imaging
Publication Date: 2020.07.22 INST NAT DI ASTROFISICA INAF
  • EP3380875B1 patent drawingFigure 1~2
  • EP3380875B1 patent drawingFigure 3~4

AI summary

An apparatus for non-invasive inspection of solid bodies by muon imaging, comprising a receiver (3) adapted to intercept a muon flux associated with cosmic rays passing through a portion of a body to be inspected, sensor means (4) adapted to detect the amount of photons or Cherenkov radiation associated with the intercepted muon flux, electronic processing means adapted to reconstruct energy and direction of the muon flux incident the portion of the body to be inspected to calculate the local density thereof. The receiver (3) comprises an optical device (5) provided with at least one receiving surface (6) having reflecting and/or diffractive properties adapted to convey the Cherenkov radiation associated with muons toward the sensor means (4), these latter comprising a multipixel detection chamber (8) adapted to provide an annular image of the muon having radius and position variable as a function of the energy and direction of muon flux.