Mura Inspection Device Dimensionality Reduction Luminance Uniformity
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Solution Overview
Problem
Display devices often suffer from mura, a phenomenon of uneven luminance due to environmental conditions and manufacturing variations, which existing technologies struggle to effectively address through uniformity correction.
Innovation Solution
A mura inspection device that measures luminance, detects distortion regions, adjusts luminance, generates a mura matrix, and applies dimensionality reduction to compress the matrix into encoding data, which is then communicated to the display device for correction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If dimensionality reduction is applied to compress the mura matrix, then the data size is reduced, but the measurement precision may be compromised
Solution Approach 1:
The patent transforms the high-dimensional mura matrix data into a lower-dimensional encoding space while preserving the essential luminance uniformity information. This dimensionality reduction is achieved through mathematical transformation that maintains the critical characteristics needed for mura defect detection and compensation, thereby reducing data size without sacrificing measurement precision.
Solution Approach 2:
The patent changes the parameter representation of luminance data by transforming the original mura matrix parameters into compressed encoding parameters. This parameter transformation allows the essential luminance uniformity characteristics to be preserved in a more compact form, achieving data compression while maintaining the accuracy required for effective mura compensation.
2Manufacturing precision
If distortion regions are adjusted to improve luminance uniformity, then the luminance uniformity is improved, but the processing complexity increases
Solution Approach 1:
The patent divides the display panel into distinct regions, identifying distortion regions separately from normal regions. By segmenting the processing target, the system can apply specific adjustment strategies to distortion regions while maintaining efficiency, thereby improving luminance uniformity without unnecessarily increasing overall processing complexity.
Solution Approach 2:
The patent applies different processing approaches to different regions of the display panel. Distortion regions receive targeted luminance adjustment while other regions follow standard processing. This localized quality approach ensures that complex processing is applied only where necessary, improving overall luminance uniformity without uniformly increasing processing complexity across the entire panel.
Data Source
AI summary
A mura inspection device may include; an optical meter configured to measure luminance of a display region and generate a first luminance matrix, a luminance preprocessor configured to detect a distortion region of the display region in relation to the first luminance matrix, and generate a second luminance matrix by adjusting luminance of the distortion region, a mura generator configured to generate a mura matrix in relation to a difference between the second luminance matrix and a reference value, and an encoder configured to generate encoding data by applying dimensionality reduction to the mura matrix.