Multiplexed Handler Interface for ATE Index Time Reduction
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Solution Overview
Problem
Automatic test equipment (ATE) and robotic handlers face significant challenges in reducing total test time, particularly due to high index times, which lead to idle equipment and reduced efficiency, as conventional methods focus on mechanical speed enhancements rather than optimizing resource utilization.
Innovation Solution
A multiplexed system that employs multiple handlers and a tester interface board to continuously switch testing between multiple load boards, allowing simultaneous testing and reducing index time by prepositioning devices for the next test cycle while the current one is being conducted.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If conventional single-handler testing method is used, then device testing can be completed, but index time is long and equipment utilization is low
Solution Approach 1:
The patent combines multiple handlers (first handler and second handler) to work with a single ATE system, allowing parallel device preparation and testing. The handlers share common resources (socket, load board, tester interface board) through multiplexing, enabling continuous operation where one handler prepares devices while the other completes testing, thereby eliminating idle index time and improving overall productivity
Solution Approach 2:
The patent implements preliminary action by having the first handler preposition devices into sockets and prepare them for testing while the ATE is still testing devices from the second handler. This advance preparation eliminates waiting time, as devices are ready immediately when testing completes, thus reducing index time and maintaining continuous testing throughput
2Speed
If mechanical speed enhancement is implemented, then handler operation speed increases, but total test time reduction is limited due to idle periods
Solution Approach 1:
The patent achieves continuity of useful action by coordinating two handlers to operate in complementary cycles. While the ATE tests devices from one handler, the other handler continuously prepares and positions new devices in sockets. This eliminates idle periods where equipment would otherwise wait for device preparation, ensuring that both the ATE and handlers are continuously productive throughout the testing process
3Productivity
If multiple handlers are used simultaneously, then testing throughput increases, but system complexity increases
Solution Approach 1:
The patent applies universality by designing the system so that multiple handlers share common resources including a single load board, socket, and tester interface board. Each handler is configured to perform the same testing functions but operates at different times in a multiplexed arrangement. This reduces system complexity compared to providing separate dedicated resources for each handler, while still achieving increased throughput through coordinated parallel operation
Data Source
AI summary
A system for connecting a test pin of automatic test equipment (ATE) to devices for testing includes a first handler for manipulating a first portion of the devices and a second handler for manipulating a second portion of the devices. The system includes a first socket for testing devices of the first portion, which is connected to a first wire, and a second socket for testing devices of the second portion, which is connected to a the second wire. A controller multiplexes the two handlers, or dual manipulators of a single handler, to operate the handlers asynchronously in coordination with testing, such that while the ATE is testing devices for one handler, the other handler presents next devices to the ATE for immediate switch of testing between devices for each handler. The system is suitable for conventional handlers and ATE.