NAND Flash Burn Data Half-Empty Block Labeling
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Solution Overview
Problem
NAND flash devices, particularly multi-level cell (MLC) devices, suffer from poor reliability due to their physical structure, which is exacerbated by the high-temperature patching process during manufacturing, leading to product quality degradation.
Innovation Solution
A method and system that identifies half-empty blocks in NAND flash burn data and writes a predetermined label character to all blank pages, converting them into full blocks to prevent data damage during the high-temperature patching process, ensuring every page is either empty or written with data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If MLC NAND flash devices are used to reduce cost, then cost advantage is improved, but reliability deteriorates due to poor physical structure
Solution Approach 1:
The patent applies preliminary action by identifying and marking half-empty blocks before the high-temperature patching process. The system scans burn data to detect blocks with partially written pages, writes predetermined mark characters to blank pages in these blocks, and converts them to full blocks before manufacturing proceeds. This preventive measure ensures that no half-empty blocks remain to be damaged during subsequent high-temperature processing, thereby maintaining reliability while enabling MLC device production.
2Productivity
If high-temperature patching process is applied to manufacture NAND flash, then manufacturing efficiency is improved, but data in NAND flash is damaged resulting in product quality degradation
Solution Approach 1:
The patent performs preliminary identification and marking of half-empty blocks in the burn data before the high-temperature patching process. By scanning the burn data, detecting blocks with partially written pages, and writing predetermined mark characters to convert them to full blocks, the system prepares the data in advance to withstand the subsequent high-temperature manufacturing process without damage.
Solution Approach 2:
The patent applies preliminary anti-action by introducing a protective mechanism against the harmful effects of high-temperature patching. The system proactively identifies blocks that would be vulnerable to temperature-induced damage and pre-marks them with predetermined characters, creating a protective state that prevents data loss during the high-temperature manufacturing process.
3Productivity
If burn data with half-empty blocks is used in high-temperature patching process, then production speed is maintained, but data damage occurs leading to quality issues
Solution Approach 1:
The patent implements preliminary action by scanning burn data to identify half-empty blocks and writing predetermined mark characters to their blank pages before the high-temperature patching process. This conversion of half-empty blocks to full blocks occurs in advance, ensuring that when the high-temperature process occurs, all blocks are in a protected state, thereby maintaining both production speed and data integrity.
Data Source
AI summary
A method for processing burn data of NAND flash is provided. The method includes: identifying all half-empty blocks in the burn data of the NAND flash, the half-empty blocks being blocks in which a part of pages are written with data and the remaining part of pages being blank pages; writing a predetermined label character to all the blank pages of the all the half-empty blocks to convert the half-empty blocks to full blocks. With the above approach, the present invention fulfills the requirement that every page is either empty or written with data, so as to prevent from damaging data in a high-temperature patching process to thereby enhance product quality and reliability.