NAND Flash Memory LSB MSB Start Voltage Programming

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Solution Overview

Problem

Conventional NAND flash memory devices use similar start voltages for both least significant bit (LSB) and most significant bit (MSB) programming operations, which limits the speed of multi-level cell programming.

Innovation Solution

A NAND flash memory device and programming method that utilize different start voltages for LSB and MSB programming operations, with the MSB start voltage being higher than the LSB start voltage, allowing for incremental step pulse programming to improve programming speed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If similar start voltages are used for both LSB and MSB programming operations, then the programming operation can be simplified, but the programming speed is limited

Engineering Contradiction:
Improveprogramming speedVSAvoidprogramming operation complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent applies different start voltages specifically for MSB programming operations while maintaining the same start voltage for LSB programming operations. This local differentiation optimizes the programming speed for MSB operations without complicating the overall programming system, as the voltage selection is based on the specific programming stage (LSB or MSB).

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent changes the voltage parameter for MSB programming operations by setting a higher start voltage compared to LSB operations. This parameter adjustment allows faster threshold voltage adjustment during MSB programming, thereby improving programming speed without requiring a complete redesign of the programming architecture.

Inventive Principle:
Principle #35Parameter changes

2Speed

If a higher MSB start voltage is used to increase programming speed, then the threshold voltage is reached faster, but over-programming may occur

Engineering Contradiction:
Improvethreshold voltage reaching speedVSAvoidprogramming accuracy
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent incorporates verification operations after programming pulses are applied to monitor the threshold voltage of memory cells. This feedback mechanism allows the system to detect when the desired threshold voltage is reached and stop further programming, preventing over-programming even when using higher start voltages for faster programming.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent uses a higher start voltage for MSB programming that exceeds what would be needed for LSB programming, accepting this excessive action temporarily to achieve faster programming. However, the verification process limits the total programming effect to the required level, utilizing the excessive voltage only for the duration needed to reach the target threshold voltage faster.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS7697327B2NAND flash memory device and programming method
Publication Date: 2010.04.13 SAMSUNG ELECTRONICS CO LTD
  • US7697327B2 patent drawing
  • US7697327B2 patent drawing
  • US7697327B2 patent drawing

AI summary

A NAND flash memory device and a programming method thereof capable of improving a program speed during a multi-level cell programming operation are provided. The device performs a programming operation using an ISPP method. Additionally, the device includes a memory cell storing multi-bit data; a program voltage generating circuit generating a program voltage to be supplied to the memory cell; and a program voltage controller controlling a start level of the program voltage. The device supplies an LSB start voltage to a selected word line during an LSB program, and an MSB start voltage higher than the LSB start voltage to the selected word line during an MSB program.