Vertical NAND Flash Pre-Pulse Control for Read Disturbance

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Solution Overview

Problem

In vertical NAND flash memory systems, the application of pre-pulses to remove boosting charges from unselected strings during read operations can slow down processing speed, leading to potential read disturbances due to hot carrier injection.

Innovation Solution

A program method for nonvolatile memory devices that includes determining the operation mode, applying a pre-pulse to unselected string selection lines only when necessary, and varying the pre-pulse duration based on the target state of the memory cell to optimize data integrity and processing speed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If pre-pulses are applied to remove boosting charges from unselected strings, then read disturbance is reduced, but processing speed is slowed down

Engineering Contradiction:
Improveread disturbance reductionVSAvoidprocessing speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies dynamic control by adjusting the pre-pulse time period based on the target state of memory cells. When memory cells are programmed to higher states requiring more charge removal, a longer pre-pulse time period is applied. When fewer charges need removal, a shorter pre-pulse time period is used. This dynamic adjustment optimizes the balance between read disturbance reduction and processing speed by applying the minimum necessary pre-pulse duration for each operational context.

Inventive Principle:
Principle #15Dynamics

2Reliability

If pre-pulses are applied to all unselected strings, then read disturbance is reduced, but device complexity increases

Engineering Contradiction:
Improvedata integrityVSAvoidcontrol complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements local quality control by selectively applying pre-pulses to specific unselected strings based on their individual charge states and the read operation requirements. Rather than uniformly applying pre-pulses to all unselected strings, the control logic determines which specific strings require charge removal and applies pre-pulses only to those strings. This localized approach reduces unnecessary control complexity while maintaining data integrity where it is actually needed.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively reduces read disturbances while maintaining or improving processing speed by selectively applying pre-pulses based on operational modes and memory cell states, ensuring data integrity without compromising program speed.

Implementation Method 1

the probability that read disturbance is generated by hot carrier injection may be high

Methodology Applied
Scientific EffectHot carrier injection:

Data Source

PatentUS9396800B2Memory system and programming method thereof
Publication Date: 2016.07.19 SAMSUNG ELECTRONICS CO LTD
  • US9396800B2 patent drawing
  • US9396800B2 patent drawing
  • US9396800B2 patent drawing

AI summary

A program method of a nonvolatile memory device is provided, which includes programming a memory cell in one string selected from a plurality of vertical strings; determining whether a mode of operation of the nonvolatile memory device is a pre-pulse mode; when the mode of operation is determined to be the pre-pulse mode, applying a pre-pulse having a predetermined level to a string selection line connected with a gate of a string selection transistor of at least one unselected vertical string of the plurality of vertical strings for a particular time period; and performing a verification operation on the programmed memory cell.