NAND Data Randomization Using LUT Inversion Seeds for Uniform Cell Wear

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Solution Overview

Problem

Existing data writing schemes in SSDs lead to non-uniform NAND cell state transitions over program erase cycles, causing premature wear and reliability issues due to repetitive programming of the same data patterns, which results in shallow erase issues and increased fail bit counts.

Innovation Solution

A look-up-table (LUT) based method is used to determine inversion seeds for different pages in a storage device, randomizing the data pattern by flipping bits based on a modulo operation and a pre-determined LUT, ensuring uniform NAND cell state transitions over program erase cycles.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If the same data pattern is repeatedly programmed to the same physical address, then the simplicity of data writing is maintained, but non-uniform NAND cell state transitions occur causing premature wear and reliability issues

Engineering Contradiction:
Improvesimplicity of data writingVSAvoidSSD endurance and reliability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent applies inversion by flipping bits of the data pattern based on a pseudo-random sequence generated from an inversion seed. This inverts the approach of directly writing data, instead writing the inverted version of data to distribute cell state transitions uniformly across different program states, thereby resolving the contradiction between writing simplicity and reliability.

Inventive Principle:
Principle #13The other way round (Inversion)

Solution Approach 2:

The patent changes the parameter of data pattern by using different inversion seeds for different program erase cycles. This causes the pseudo-random inversion sequence to vary, thereby changing how bits are flipped and distributing cell transitions uniformly across all program states, improving reliability while maintaining operational simplicity.

Inventive Principle:
Principle #35Parameter changes

2Speed

If data is written without randomization, then the speed of data writing is maintained, but shallow erase issues and increased fail bit counts occur due to non-uniform cell state transitions

Engineering Contradiction:
Improvedata writing speedVSAvoiderase reliability and fail bit count
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent performs preliminary action by generating a pseudo-random inversion sequence and determining the inversion seed before the actual data writing process. This preliminary randomization preparation ensures that when data is written, the cell state transitions are already distributed uniformly, preventing shallow erase issues and reducing fail bit counts without slowing down the writing speed.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements periodic action by using different inversion seeds for different program erase cycles. This periodic variation of the inversion seed causes the pseudo-random inversion pattern to change systematically, ensuring uniform distribution of cell state transitions across all cycles and preventing cumulative wear issues.

Inventive Principle:
Principle #19Periodic action

3Reliability

If uniform cell state transition distribution is achieved through bit-flipping, then NAND cell wear is balanced, but the complexity of the data writing process increases due to LUT-based inversion seed determination

Engineering Contradiction:
Improveuniform cell wear distributionVSAvoiddata writing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies self-service by using a look-up table that automatically provides the appropriate inversion seed based on the current program erase cycle count and physical address. This self-service mechanism eliminates the need for complex algorithms to determine inversion seeds, as the LUT autonomously provides the correct seed, thereby reducing process complexity while maintaining uniform cell wear distribution.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent introduces an intermediary element - the look-up table - that mediates between the program erase cycle parameters and the inversion seed selection. This intermediary simplifies the relationship by pre-computing and storing optimal inversion seeds, thereby reducing the complexity of real-time calculations while ensuring uniform cell state transition distribution.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS20250390379A1Approach Uniform NAND Cell State Transition over Program Erase Cycles Using Look Up Table
Publication Date: 2025.12.25 SK HYNIX INC
  • US20250390379A1 patent drawing
  • US20250390379A1 patent drawing
  • US20250390379A1 patent drawing

AI summary

A method and associated memory system for randomizing memory storage data. The method and system receive at a data inverter user data and meta data sequence having an inversion seed bit, determine a value for the inversion seed bit from a look up table specifying inversion seeds for different pages of data to be stored in a memory, depending on the value of the inversion seed bit, bit-flip the user data and meta data sequence except for the inversion seed bit; and regardless of bit-flipping, exclusive OR (XOR) the user data and meta data sequence with a random sequence to produce an XORed sequence for storage in the memory as randomized data.