3D NAND Stack Support Layout for Capacity and Structural Stability

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Solution Overview

Problem

There is a demand for increasing the data storage capacity of semiconductor devices, and existing methods, such as using three-dimensionally arranged memory cells, require improvements in structural stability and efficiency.

Innovation Solution

A semiconductor device with a stack structure featuring gate electrodes and interlayer insulating layers, including channel and support structures with varying widths and distances to enhance structural stability and data storage capacity, and a data storage system with a controller for managing these components.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If three-dimensionally arranged memory cells are used to increase data storage capacity, then storage capacity is improved, but structural stability deteriorates

Engineering Contradiction:
Improvedata storage capacityVSAvoidstructural stability
Core Design Contradiction:
Quantity of substanceVSStability of the object's composition

Solution Approach 1:

The stack structure is divided into multiple regions (memory cell array region and step region) with different functions. The step region contains support structures that segment the overall structure to provide localized reinforcement without affecting the entire device, thus maintaining stability while enabling high-density memory cells in the memory cell array region.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the stack structure are given different properties: the memory cell array region is optimized for high-density storage with closely spaced memory cells, while the step region provides structural support with wider-spaced support structures. This local differentiation allows each region to optimize its function without compromising the other.

Inventive Principle:
Principle #3Local quality

2Quantity of substance

If memory cells are arranged in three dimensions to increase capacity, then storage capacity is improved, but manufacturing complexity increases

Engineering Contradiction:
Improvedata storage capacityVSAvoidstructural complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The manufacturing process is segmented into distinct stages: forming the stack structure with alternating insulating layers and sacrificial layers, creating memory cell holes through selective removal, and forming support structures in the step region. This segmentation simplifies the overall manufacturing complexity by breaking down the three-dimensional structure creation into manageable sequential steps.

Inventive Principle:
Principle #1Segmentation

3Stability of the object's composition

If support structures with varying widths are used in different regions, then structural stability is improved, but manufacturing precision requirements increase

Engineering Contradiction:
Improvestructural stabilityVSAvoiddimensional precision
Core Design Contradiction:
Stability of the object's compositionVSManufacturing precision

Solution Approach 1:

The support structures are designed with different widths in different regions: wider support structures in regions requiring greater stability and narrower support structures in regions where space is constrained. This local quality approach allows the structure to optimize stability where needed while maintaining manufacturability through standardized fabrication processes that can accommodate controlled dimensional variations.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS12532471B2Semiconductor devices and data storage systems including the same
Publication Date: 2026.01.20 SAMSUNG ELECTRONICS CO LTD
  • US12532471B2 patent drawing
  • US12532471B2 patent drawing
  • US12532471B2 patent drawing

AI summary

A semiconductor device includes a stack structure having gate electrodes and interlayer insulating layers, the stack structure having a cell region and a step region, and the gate electrodes extending in a first direction to have a step shape in the step region, channel structures through the stack structure in the cell region, separation structures through the stack structure and extending in the first direction, and support structures between the separation structures and through the stack structure in the step region. The step region includes first and second regions, the first region closer to the cell region in the first direction than the second region is, the support structures include first and second support structures through the stack structure in the first and second regions, respectively, a maximum width of the first support structure being greater than that of the second support structure.