NAND Memory XOR Set Programming Direction Balance

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Solution Overview

Problem

The increasing number of word lines in memory devices leads to inconsistent programming, resulting in variable bit error rates and a higher risk of memory device failure due to uneven distribution of strong and weak word lines across XOR sets.

Innovation Solution

Programming word lines of different dies in alternating directions, with approximately half programmed in a normal order and the other half in a reverse order, to distribute strong and weak word lines more evenly across XOR sets, reducing the concentration of weak word lines in any single XOR set.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the number of word lines is increased to improve memory density, then memory capacity is improved, but programming consistency deteriorates

Engineering Contradiction:
Improvememory capacityVSAvoidprogramming consistency
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The patent segments the word lines into multiple XOR sets, where each set contains word lines from different dies. This segmentation allows independent programming of different XOR sets, improving programming consistency by reducing the impact of variations in individual word lines while maintaining high memory capacity through increased word line count.

Inventive Principle:
Principle #1Segmentation

2Device complexity

If word lines are programmed in a single direction, then programming process is simple, but XOR set reliability deteriorates

Engineering Contradiction:
Improveprogramming process complexityVSAvoidXOR set reliability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies reverse programming to certain XOR sets while using normal programming for others. Specifically, XOR sets with odd indices are programmed in reverse order (from highest to lowest word line indices) while XOR sets with even indices are programmed in normal order (from lowest to highest word line indices). This inversion strategy balances the distribution of strong and weak word lines across XOR sets, improving reliability without significantly increasing process complexity.

Inventive Principle:
Principle #13The other way round (Inversion)

3Ease of operation

If all dies are programmed in the same direction, then programming control is simple, but bit error rate increases

Engineering Contradiction:
Improveprogramming controlVSAvoidbit error rate
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The patent applies different programming directions to different XOR sets based on their local characteristics. By identifying which XOR sets benefit from reverse programming and applying it selectively, the patent reduces bit error rates locally in those sets while maintaining simple control overall through systematic assignment of programming directions to XOR sets.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS11967382B2Mixing normal and reverse order programming in NAND memory devices
Publication Date: 2024.04.23 SANDISK TECHNOLOGIES LLC
  • US11967382B2 patent drawing
  • US11967382B2 patent drawing
  • US11967382B2 patent drawing

AI summary

The memory device includes a plurality of dies, and each die includes a plurality of blocks with a plurality of word lines. Some of the word lines are arranged in a plurality of exclusive OR (XOR) sets with each XOR set containing word lines in the same positions across the plurality of dies. The memory device further includes a controller that is configured to program the word lines of the blocks of at least one of the dies in a first programming direction. The controller is further configured to program the word lines of the blocks of at least one other die in a second programming direction that is opposite of the first programming direction.