Nanocrystal Electron Diffraction for Rapid Structural Characterization

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Solution Overview

Problem

X-ray crystallography is hindered by the difficulty in obtaining adequate crystals, and existing methods struggle with characterizing individual components in complex mixtures, particularly in chemical and biological sciences, due to the need for laborious sample preparation and the challenge of identifying unknown compounds in heterogeneous samples.

Innovation Solution

The use of nanocrystals, composed of chemical compounds with molecular weights smaller than typical proteins, and electron beams to obtain diffraction patterns, allowing for rapid determination of structural models and identification of components in complex mixtures through MicroED, which eliminates the need for extensive sample preparation and purification.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If X-ray crystallography is used to determine structural models, then high precision structural information can be obtained, but adequate crystals of at least 50 micrometers are required which is difficult to obtain

Engineering Contradiction:
Improvestructural model precisionVSAvoidcrystal preparation difficulty
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The invention segments the crystal size requirement by transitioning from macroscopic crystals (50 micrometers) to nanoscale crystals (nanocrystals). This segmentation allows structural determination from much smaller crystal dimensions that can be obtained more readily from molecular compounds, resolving the contradiction between precision and preparation difficulty.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention changes the size parameter of crystals from micrometer-scale to nanometer-scale. This parameter change enables the use of nanocrystals that can be formed more easily from a broader range of molecular compounds, while still providing sufficient diffraction quality for structural determination through advanced electron microscopy techniques.

Inventive Principle:
Principle #35Parameter changes

2Loss of information

If traditional methods are used to characterize compounds in complex mixtures, then molecular mass and fragmentation patterns can be obtained, but unambiguous identification of individual analytes remains challenging

Engineering Contradiction:
Improvecompound identification accuracyVSAvoidseparation and purification complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The invention extracts structural information directly from nanocrystals present in complex mixtures without requiring complete separation or purification of individual compounds. By targeting the crystallized components and obtaining their electron diffraction patterns, the method extracts definitive structural data that enables unambiguous identification while avoiding the complex separation procedures.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The invention replaces the mechanical separation and purification processes with an analytical approach using electron diffraction. Instead of physically separating compounds through chromatography or other purification methods, the method uses electron beams to obtain diffraction patterns from nanocrystals, substituting mechanical separation with a direct structural characterization approach.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Productivity

If nanocrystals are used with electron beams for structural determination, then rapid structural model determination can be achieved in minutes, but the method must be validated for accuracy

Engineering Contradiction:
Improvestructural determination speedVSAvoidmethod accuracy
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The invention implements feedback validation by comparing electron diffraction-based structural models with known crystal structures or using multiple diffraction patterns to refine and verify the determined structure. This feedback mechanism ensures that the rapid structural determination maintains high reliability and accuracy despite the reduced time compared to traditional X-ray crystallography.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the rapid determination of structural models in minutes with less complex sample preparation, is applicable to a broader range of molecules, and allows for unambiguous identification of components in mixtures, overcoming the limitations of traditional X-ray crystallography.

Implementation Method 1

using electron beams to obtain diffraction from said nanocrystals

Methodology Applied
Scientific EffectElectron diffraction: Diffraction

Data Source

PatentUS12259343B2Systems and methods for structurally characterizing compounds
Publication Date: 2025.03.25 CALIFORNIA INST OF TECH
  • US12259343B2 patent drawing
  • US12259343B2 patent drawing
  • US12259343B2 patent drawing

AI summary

The present disclosure provides methods of collecting electron diffraction patterns from nanocrystals to obtain a three-dimensional structural model of a compound, as well as methods of identifying compounds and methods of determining polymorphic forms. In addition, the present disclosure provides methods of characterizing a first compound from a sample, as well as methods of screening compounds from a sample. The present disclosure also provides systems for characterizing a compound from a sample, which systems include modules for high-performance liquid chromatography, dispensing, and electron microscopy.