Nanoparticle Analyzer Merging Mass and Capacitive Sensing
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Solution Overview
Problem
Current methods for analyzing nanoparticles are costly, bulky, and require a vacuum system, making them inefficient for determining both size and material properties of nanoparticles like nanoplastics and viruses, which often require additional metal coating steps.
Innovation Solution
A low-cost, portable analyzer that simultaneously measures the mass and capacitance change of nanoparticles using a capacitive sensor, allowing for the determination of both size and material properties without the need for additional steps or devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional methods (SEM, TEM, AFM, DLS, CDMS, IMS) are used to measure physical properties of nanoparticles, then size measurement is achieved, but material characterization is not provided
Solution Approach 1:
The patent combines mass spectrometry (NEMS-MS) with capacitive sensing in a single integrated device. The mass spectrometer provides mass measurement while the capacitive sensor simultaneously measures capacitance changes, enabling both size determination and material characterization without requiring separate instruments or vacuum systems.
Solution Approach 2:
The device performs multiple functions: it measures mass, determines size, and identifies material properties all within a single nanoparticle analysis system. This multi-functional approach eliminates the need for multiple specialized instruments and provides comprehensive nanoparticle characterization in one measurement.
2Measurement precision
If XPS, EDS, and Raman spectrometry are used for material characterization, then material identification is achieved, but particle size information is not provided
Solution Approach 1:
The patent merges material characterization capabilities (through capacitive sensing) with mass measurement in a single integrated device. The capacitive sensor measures capacitance changes that provide material identification, while the mass spectrometer simultaneously provides mass and size information, combining both measurement types in one instrument.
3Measurement precision
If SEM and EDS are combined for simultaneous physical and material analysis, then both size and material properties are determined, but the device becomes costly, bulky, and requires a vacuum system
Solution Approach 1:
The patent replaces the mechanical vacuum system required by conventional SEM-EDS devices with a capacitive sensing mechanism that operates in atmospheric conditions. The capacitive sensor measures electrical properties without requiring vacuum, substituting a complex mechanical vacuum system with a simpler electrical measurement approach.
Solution Approach 2:
The device uses a portable, cost-effective design that eliminates expensive vacuum systems and bulky components. By using capacitive sensing and mass spectrometry in an integrated portable device, the patent achieves simultaneous analysis without the high cost and complexity of conventional instruments.
4Reliability
If metal coating is applied to non-conductive samples before SEM measurement, then measurement reliability is improved, but analysis time and cost increase
Solution Approach 1:
The capacitive sensor directly measures the electrical properties of nanoparticles without requiring prior metal coating. The sensor itself provides the necessary electrical field interaction, making the measurement process self-sufficient and eliminating the need for preparatory coating steps that consume time and resources.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and cost-effective analysis of nanoparticles, including nanoplastics and viruses, by providing a single device capable of determining size and material properties, overcoming the limitations of existing technologies.
Implementation Method 1
both the mass of the nanoparticle and the change in capacitance induced on a capacitive sensor by the nanoparticle are measured simultaneously
Implementation Method 2
the change in capacitance induced on a capacitive sensor by the nanoparticle
Implementation Method 3
both the mass of the nanoparticle and the change in capacitance induced on a capacitive sensor by the nanoparticle are measured simultaneously
Data Source
AI summary
The present invention relates to an analyzer and method for simultaneously determining both size and material properties of a single nanoparticle. In the present invention, both the mass of the nanoparticle and the change in capacitance induced on a capacitive sensor by the nanoparticle are measured simultaneously, and thus the size and material properties of the nanoparticle are determined. An analyzer for simultaneously determining the size and material properties of a nanoparticle is described with the present invention, this device comprises a mass sensor, a capacitor sensor and a common precise measurement region of the mass sensor and capacitor sensor, wherein said mass sensor and capacitor sensor provide common measurement. The present invention can be used in the field of biomedical, environmental engineering and materials engineering.