Nanoparticle Sample for 3D Shape Measurement
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Solution Overview
Problem
Current methods for measuring the three-dimensional shape of nanoparticles suffer from reproducibility issues and fail to accurately capture the shape of non-spherical particles due to probe shape effects and aggregation, leading to incomplete information on particulate species.
Innovation Solution
A method involving a substrate with isolated nanoparticles and standard nanoparticles disposed nearby, allowing for simultaneous measurement and correction of probe shape effects, enabling accurate three-dimensional shape analysis and species evaluation by using scanning probe or charged particle beam microscopy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional measurement methods using SPM or charged particle microscopes are employed, then three-dimensional shape information can be obtained, but measurement reproducibility deteriorates due to probe shape effects and aggregation
Solution Approach 1:
The patent applies preliminary action by preparing a substrate with isolated nanoparticles and standard nanoparticles disposed nearby before measurement. This pre-arranged configuration allows the probe shape effects to be identified and corrected using the standard nanoparticles, thereby improving measurement reproducibility while maintaining three-dimensional shape measurement accuracy.
2Measurement precision
If standard nanoparticles are disposed nearby on the same substrate, then probe shape effects can be corrected simultaneously, but sample preparation complexity increases
Solution Approach 1:
The patent merges the measurement of standard nanoparticles and target nanoparticles into a single measurement process by disposing both types of particles on the same substrate. This combination allows simultaneous identification and correction of probe shape effects, improving measurement precision while the standardized preparation protocol actually reduces overall complexity compared to separate measurements.
3Quantity of substance
If nanoparticles are dispersed in solution and dropped onto substrate, then particle distribution can be achieved, but aggregation occurs leading to loss of information on particulate species
Solution Approach 1:
The patent applies local quality by creating specific local environments on the substrate that prevent aggregation. The substrate is designed with properties that promote isolated nanoparticle dispersion in certain regions, allowing each particle to maintain its individual characteristics and enabling accurate identification of particulate species without information loss.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances measurement reproducibility and accuracy, providing detailed information on particle size, distribution, and species characteristics, including aspect ratio, surface roughness, and phase differences.
Implementation Method 1
measuring the three-dimensional shape image of the silica nanoparticles by means of an atomic force microscope (AFM)
Implementation Method 2
charged particle microscopes (hereinafter, referred to as charged particle microscopes) as scanning probe microscopes (SPM) and scanning electron microscopes (SEM)
Data Source
AI summary
To provide a sample for measuring particles enabling the three-dimensional particulate shape to be measured and the particulate species to be evaluated, the sample for measuring particles includes a substrate; isolated nanoparticles to be measured which are disposed on the substrate; and isolated standard nanoparticles which are disposed on the substrate in the vicinity of the isolated nanoparticles to be measured.