Nanoparticle Screening Chip for Rapid Property Characterization

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current methods for characterizing nanoparticles are time-consuming and require expensive equipment, failing to simultaneously determine size distribution and surface properties like hydrophobicity and charge in a single, efficient step.

Innovation Solution

A nanoparticle screening chip with a substrate having areas with defined surface energy components and subareas with different aperture sizes, combined with a method involving incubation and microscopy to rapidly assess nanoparticle properties by analyzing their affinity to various surface properties.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple characterization techniques (optical/imaging for size, XPS/ToF-SIMS for surface properties) are used to determine nanoparticle properties, then measurement precision is improved, but loss of time and device complexity increase

Engineering Contradiction:
Improvenanoparticle property characterizationVSAvoidcharacterization time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent combines multiple characterization functions (size determination and surface property analysis) into a single screening chip device. The chip integrates areas with different surface properties and subareas with varying aperture sizes, allowing simultaneous measurement of both nanoparticle size and surface characteristics through one unified system rather than separate techniques.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The screening chip is designed as a multi-functional device that can determine multiple nanoparticle properties (size, surface charge, hydrophobicity) using a single platform. The various areas and subareas of the chip serve different characterization purposes, making the device universal for comprehensive nanoparticle analysis without requiring multiple specialized instruments.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If multiple characterization techniques (XPS, ToF-SIMS) are used to determine surface properties, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improvesurface property determinationVSAvoidcharacterization equipment
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent employs a disposable screening chip that can be manufactured at low cost and used for rapid characterization. Instead of requiring expensive, complex, and specialized equipment like XPS or ToF-SIMS instruments, the invention uses a simple, inexpensive chip that provides sufficient characterization capability for quality control applications, eliminating the need for costly specialized devices.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent replaces complex mechanical and optical characterization systems (microscopes, spectrometers) with a simpler affinity-based sorting mechanism. Nanoparticles are characterized by their natural affinity to different surface properties on the chip areas, eliminating the need for complex imaging and analysis equipment while maintaining measurement capability.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Productivity

If a single method is used to determine both size distribution and surface properties, then productivity is improved, but measurement precision may worsen

Engineering Contradiction:
Improvecharacterization speedVSAvoidproperty determination accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The screening chip is segmented into multiple areas, each with different surface properties (hydrophobicity, charge), and each area contains subareas with different aperture sizes. This segmentation allows the chip to simultaneously perform size determination (through aperture filtering) and surface property analysis (through affinity-based sorting) in parallel, maintaining both speed and accuracy.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different areas of the chip are assigned different local qualities (surface properties) optimized for specific measurement purposes. Some areas are designed for size filtering with specific aperture sizes, while other areas have surface properties optimized for detecting hydrophobicity or charge. This local optimization ensures that each region contributes to accurate measurement of specific properties while the whole chip operates efficiently.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables rapid and efficient determination of nanoparticle size, size distribution, surface charge, and hydrophobicity, facilitating quicker characterization and quality control in industrial processes, particularly for nanomedicine products.

Implementation Method 1

incubating the nanoparticles in solution over the working surface during a time t and preferably thereafter rinsing the nanoparticle screening chip

Methodology Applied
Scientific EffectAdsorption: Adsorption

Implementation Method 2

each of these areas presents different surface properties defined by surface energy component (d,b,a), the total free energy γTOT of the surface of each area

Methodology Applied
Scientific EffectSurface energy interaction: Surface Tension

Implementation Method 3

determining physical properties of the nanoparticles by analyzing the nanoparticle screening chip by microscopy, preferably optical microscopy

Methodology Applied
Scientific EffectLight scattering: Scattering

Data Source

PatentUS10408727B2Screening of nanoparticle properties
Publication Date: 2019.09.10 EUROPEAN COMMUNITY (EC)
  • US10408727B2 patent drawing
  • US10408727B2 patent drawing
  • US10408727B2 patent drawing

AI summary

A nanoparticle screening chip and a method using said chip allowing for determining physical properties of nanoparticles, wherein the screening chip comprises a substrate having a working surface divided into a plurality of areas, wherein (1) each of these areas presents different surface properties defined by surface energy component (d,b,a), the total free energy γTOT of the surface of each area being defined as follows: γTOT=γLW+2(γ+γ−)0.5, wherein the components are: γLW=dispersive component=d, γ+=electron acceptor component=b, γ−=electron donor component=a; and (2) each of these areas comprises a plurality of subareas, each subarea comprising an array of sub-micrometric holes or elongated grooves with a different aperture size (S1, S2, S3, . . . ).