Nanoparticle Detection Threshold Correction for Disc Warping

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Solution Overview

Problem

The existing nanoparticle measurement devices face accuracy issues due to disc warping during the formation of reaction regions, leading to fluctuations in low-frequency components when scanned with laser light, which decreases the detection accuracy of nanoparticles.

Innovation Solution

A nanoparticle measurement device that includes a timing signal generation unit, a low-frequency component extraction unit, a low-frequency component calculation unit, and a threshold correction unit to account for disc warping, allowing for accurate detection of nanoparticles by generating corrected timing signals and thresholds.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the specimen analysis disc is scanned with laser light to detect nanoparticles, then nanoparticle detection is achieved, but disc warping causes low-frequency component fluctuations that decrease detection accuracy

Engineering Contradiction:

Improvenanoparticle detection accuracyVSAvoiddetection accuracy stability

Core Design Contradiction:

Measurement precisionVSReliability

Solution Approach 1:

The patent measures the low-frequency component fluctuations caused by disc warping before nanoparticle detection and generates correction data in advance. This preliminary measurement and correction data generation allows the system to compensate for warping effects during the actual detection process, improving measurement precision while maintaining detection reliability

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The system uses the measured low-frequency component fluctuations as feedback to adjust and correct the detection threshold. By continuously monitoring the warping-induced fluctuations and adjusting the threshold accordingly, the system maintains stable detection accuracy despite disc warping variations

Inventive Principle:

Principle #23Feedback

2Adaptability or versatility

If the reaction region is formed on the disc, then nanoparticle capture capability is achieved, but disc warping occurs during the formation process

Engineering Contradiction:

Improvenanoparticle capture capabilityVSAvoiddisc flatness

Core Design Contradiction:

Adaptability or versatilityVSShape

Solution Approach 1:

The patent converts the harmful effect of disc warping into a measurable and correctable parameter. By measuring the low-frequency component fluctuations caused by warping and using this information to adjust the detection threshold, the system transforms the warping defect into a manageable variable that can be compensated for through signal processing

Inventive Principle:

Principle #22Blessing in disguise (Convert harm into benefit)

3Productivity

If the disc is scanned to detect nanoparticles, then detection function is achieved, but warping influence cannot be fully eliminated

Engineering Contradiction:

Improvedetection efficiencyVSAvoidnanoparticle detection precision

Core Design Contradiction:

ProductivityVSMeasurement precision

Solution Approach 1:

The patent introduces an intermediary correction mechanism that mediates between the warping-induced signal fluctuations and the nanoparticle detection threshold. By measuring low-frequency components and using them to adjust the threshold, this intermediary process isolates the detection system from the direct impact of disc warping, maintaining both detection efficiency and precision

Inventive Principle:

Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively reduces the influence of disc warping on nanoparticle detection accuracy, improving the precision of nanoparticle counting and detection by compensating for low-frequency component fluctuations.

Implementation Method 1

a laser light is radiated to the reaction region and a reflected light is received from the reaction region

Methodology Applied

Scientific EffectLight reflection: Reflection

Data Source

PatentUS11499968B2Nanoparticle measurement device, analysis device, and analysis method

Publication Date: 2022.11.15 JVC KENWOOD CORP

AI summary

A nanoparticle measurement device includes a timing signal generation unit, a low-frequency component extraction unit, a low-frequency component calculation unit, a threshold correction unit, and a measurement unit. The timing signal generation unit generates timing signals. The low-frequency component extraction unit extracts low-frequency components according to the timing signals. The low-frequency component calculation unit calculates an interpolated low-frequency component in accordance with the low-frequency components. The threshold correction unit sets a corrected threshold in accordance with the interpolated low-frequency component. The measurement unit extracts and counts nanoparticle pulse signals from a light reception signal according to the timing signals and the corrected threshold.