Nanoscale Electrode Arrays for Submicron Particle Manipulation

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Solution Overview

Problem

Conventional lab-on-chip systems are limited in manipulating and detecting small-scale particles, such as nanometer-scale biological entities, due to the large size of dielectrophoresis electrodes and the difficulty in optically detecting particles smaller than the diffraction limit of visible light.

Innovation Solution

The development of a system with a dense array of nanometer-scale electrodes integrated into a lab-on-chip device, allowing for efficient electronic manipulation and detection of small-scale particles using multiple frequency dielectrophoresis, and employing macro-scale optical detection techniques to identify particles arranged in specific spatial patterns like diffraction gratings.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of moving object

If conventional dielectrophoresis electrodes are used, then the device structure is simple, but the electrode size is large (10s of microns) and cannot manipulate nanometer-scale particles effectively

Engineering Contradiction:
Improveelectrode sizeVSAvoiddevice structure
Core Design Contradiction:
Length of moving objectVSDevice complexity

Solution Approach 1:

The patent transitions from planar 2D electrode configurations to 3D vertically-stacked electrode layers, enabling nanometer-scale electrode dimensions while maintaining manufacturability through standard semiconductor fabrication processes. The handle silicon removal technique exposes active semiconductor layers at the surface, allowing formation of extremely small electrodes in the vertical dimension.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent divides the electrode system into multiple vertically-stacked layers, each layer containing arrays of small electrodes. This segmentation allows each electrode to be miniaturized to nanometer scale while the overall system maintains complexity management through modular layering and standardized fabrication processes.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If particles are made smaller than the diffraction limit of visible light, then the particle size resolution improves, but optical detection becomes difficult or impossible

Engineering Contradiction:
Improveparticle size resolutionVSAvoidoptical detection
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent introduces an intermediary optical detection mechanism where particles are first manipulated into ordered spatial patterns (diffraction gratings) by the electrode arrays, and then these patterns serve as intermediaries for macro-scale optical detection. The diffraction grating pattern makes sub-diffraction particles detectable by converting their positions into a spatially-resolved optical signal.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the spatial arrangement parameter of particles from random distribution to ordered diffraction grating patterns. This parameter change enables optical detection because the ordered patterns create measurable diffraction signals, whereas randomly distributed sub-diffraction particles would be undetectable by conventional optical microscopy.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If densely integrated electrode arrays are implemented, then spatial granularity and manipulation precision improve, but manufacturing complexity increases

Engineering Contradiction:
Improvespatial granularityVSAvoidmanufacturing complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent makes the active semiconductor layer serve multiple functions: it acts as both the structural substrate for electrode formation and the material from which electrodes are patterned. This multi-functionality allows densely integrated electrode arrays to be manufactured using standard semiconductor fabrication processes, reducing manufacturing complexity despite high spatial granularity requirements.

Inventive Principle:
Principle #6Universality (Multi-functionality)

4Adaptability or versatility

If multiple frequency dielectrophoresis techniques are used, then particle manipulation selectivity improves, but the system complexity increases

Engineering Contradiction:
Improveparticle manipulation selectivityVSAvoidsystem complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent implements dynamic control of electrode potentials by applying multiple alternating current frequencies to different electrode layers. This dynamic manipulation allows selective control of different particle types based on their frequency-dependent dielectric properties, achieving high selectivity while using standard electrical control circuits.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the efficient manipulation and detection of submicron and nanometer-scale particles with high spatial granularity and selectivity, overcoming the limitations of conventional systems by using dense electrode arrays and innovative optical detection methods.

Implementation Method 1

efficient dielectrophoresis and detection of small-scale particles

Methodology Applied
Scientific EffectDielectrophoresis: Dielectric Permittivity

Implementation Method 2

employing electrophoresis (EP), dielectrophoresis (DEP) or multiple frequency dielectrophoresis (MFDEP)

Methodology Applied
Scientific EffectElectrophoresis: Electrophoresis

Implementation Method 3

the formation of specific spatial patterns, such as diffraction gratings, and providing accurate optical readouts

Methodology Applied
Scientific EffectDiffraction: Diffraction

Data Source

PatentUS8815071B2Manipulation, detection, and assay of small scale biological particles
Publication Date: 2014.08.26 UNIV OF PITTSBURGH OF THE COMMONWEALTH SYST OF HIGHER EDUCATION
  • US8815071B2 patent drawing
  • US8815071B2 patent drawing
  • US8815071B2 patent drawing

AI summary

Systems, devices, and methods are presented that facilitate electronic manipulation and detection of submicron particles. A particle manipulation device contains a plurality of electrodes formed on an active semiconductor layer of an integrated circuit chip, where the electrodes and gap spacing between adjacent electrodes is submicron in size. The chip is oriented with its substrate face up, and at least a portion of the substrate is removed from the chip so the electrodes are in close proximity to a fluid chamber(s) placed over the chip, to facilitate manipulation of particles, contained in a buffer solution in the fluid chamber(s), to form a defined pattern. Innovative macro-scale optical detection is employed to detect the submicron particles, where a light beam is applied to the defined pattern, and interaction of the defined pattern with the light beam is detected and evaluated to facilitate detecting the particles.