Fixing Rotating Member with Nanoscale Silver Layer for Crack Resistance
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Solution Overview
Problem
Existing electro-conductive layers in electromagnetic induction heating type fixing devices suffer from conductivity loss due to oxidation and poor durability, particularly at the nip portion, leading to cracks and reduced longevity.
Innovation Solution
A fixing rotating member with an electro-conductive layer composed of silver nanoparticles, having an average crystal grain size of 20 to 200 nm and a volume resistivity of 1.0×10−8 to 8.0×10−8 Ω·m, is used to enhance conductivity and durability by dispersing tensile stress and reducing crack formation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a conventional electro-conductive layer is used in the fixing rotating member, then the device can perform electromagnetic induction heating, but the electro-conductive layer suffers from conductivity loss due to oxidation and poor durability against repeated strain
Solution Approach 1:
The patent changes the physical parameters of the silver layer by controlling the average crystal grain size to be 0.01 μm or less (transforming it into a nanoscale structure). This parameter change fundamentally improves both durability against repeated strain and resistance to conductivity loss, while maintaining the electromagnetic induction heating function. The fine crystal grain structure provides numerous grain boundaries that effectively disperse strain stress and prevent crack propagation.
2Reliability
If the electro-conductive layer is made thinner to improve flexibility and reduce oxidation, then durability against strain improves, but conductivity may decrease
Solution Approach 1:
The patent transforms the silver layer into a nanoscale structure with average crystal grain size of 0.01 μm or less. This drastic parameter change in crystal grain size allows the layer to maintain high conductivity despite reduced thickness, because the nanoscale structure provides numerous grain boundaries that enhance electron scattering control while maintaining overall conductive performance. Simultaneously, the thin nanoscale structure improves flexibility and resistance to oxidation.
3Reliability
If the average crystal grain size of silver is reduced to suppress cracking, then durability improves, but manufacturing precision requirements increase
Solution Approach 1:
The patent establishes a specific parameter threshold (average crystal grain size ≤ 0.01 μm) that can be achieved through conventional sintering processes. This parameter change is deliberately set within a range that balances durability improvement with manufacturability. The threshold value is carefully chosen to be achievable by standard industrial sintering techniques while providing sufficient grain boundaries to prevent crack propagation in the electro-conductive layer.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides a fixing rotating member with improved conductivity and durability, ensuring stable operation and extended lifespan by suppressing crack formation at crystal interfaces.
Implementation Method 1
an electromagnetic induction heating type fixing device including a fixing rotating member provided with an electro-conductive layer, the device being able to cause the electro-conductive layer to directly generate heat
Implementation Method 2
an induction heating device that causes the fixing rotating member to generate heat by induction heating
Data Source
AI summary
A fixing rotating member comprising: a base material and an electro-conductive layer on the base material; the electro-conductive layer extending in a circumferential direction of an outer peripheral surface of the base material, the electro-conductive layer comprising silver, an average crystal grain size of crystals of the silver observed in a cross section along a circumferential direction of the electro-conductive layer being 20 to 200 nm, and the electro-conductive layer having a volume resistivity of 1.0×10−8 to 8.0×10−8 Ω·m.