Nanostructure Transistor Buffer Layer for Dopant Diffusion Control

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Solution Overview

Problem

Dopants from the doped epitaxial material in the source/drain region of nanostructure transistors diffuse into the mesa region, leading to increased electron tunneling, short channel effects, and leakage, which degrade device performance.

Innovation Solution

A buffer layer is formed under the source/drain region with a specific shape and dimensions to prevent dopant diffusion, including a curved top surface and extending over shallow trench isolation regions, fully separating the source/drain region from the mesa region.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If dopants are introduced into the source/drain region, then electrical conductivity is improved, but dopant diffusion into the mesa region increases short channel effects and leakage

Engineering Contradiction:
Improveelectrical conductivityVSAvoidshort channel effects
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

An undoped epitaxial layer is introduced as an intermediary barrier between the doped source/drain region and the mesa region. This buffer layer physically separates the dopants from the mesa region, preventing diffusion while maintaining the electrical conductivity benefits of doping in the source/drain region. The undoped layer acts as a mediator that blocks harmful dopant migration without interfering with the desired electrical properties.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The semiconductor structure is segmented into distinct regions: a doped epitaxial layer for the source/drain region, an undoped epitaxial buffer layer as a separation barrier, and the mesa region. This segmentation isolates the dopants to their intended functional area while preventing them from diffusing into adjacent regions, thereby resolving the contradiction between achieving good electrical conductivity and preventing harmful diffusion effects.

Inventive Principle:
Principle #1Segmentation

2Reliability

If the buffer layer extends over shallow trench isolation regions, then complete separation from mesa region is achieved, but manufacturing complexity increases

Engineering Contradiction:
Improveseparation completenessVSAvoidbuffer layer structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The undoped epitaxial layer serves multiple functions simultaneously: it acts as a dopant diffusion barrier, provides mechanical support for subsequent processing steps, defines the boundary between source/drain and mesa regions, and extends over shallow trench isolation regions to ensure complete separation. By making the buffer layer multi-functional, the design achieves complete separation without proportionally increasing manufacturing complexity, as a single layer performs multiple protective and definitional roles.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The buffer layer reduces short channel effects, decreases off-current, and minimizes leakage, thereby enhancing the performance of nanostructure transistors.

Implementation Method 1

Dopants from the doped epitaxial material in the source/drain region of nanostructure transistors diffuse into the mesa region

Methodology Applied
Scientific EffectDiffusion: Diffusion

Data Source

PatentUS20250301728A1Semiconductor device and methods of manufacturing
Publication Date: 2025.09.25 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250301728A1 patent drawing
  • US20250301728A1 patent drawing
  • US20250301728A1 patent drawing

AI summary

In some implementations, a buffer layer is formed under a source/drain region of a device. A shape of the buffer layer may include a curved top surface having a height that extends to increase coverage of nanosheets of a fin structure of the device. The shape also includes regions having widths that extend towards shallow trench isolation regions of the device. The shape reduces a likelihood of dopants diffusing from the source/drain region into a mesa region of the fin structure. As a result, a performance of the device may be increased by decreasing short channel effects, decreasing an off-current of the device, and decreasing leakage within the device, among other examples.