Nanostructure Production via Selective Thermal Evaporation

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Solution Overview

Problem

Existing methods for producing nanostructures, such as nanowires and quantum dots, face challenges in achieving precise control over dimensions, orientation, and purity, with issues like metal contamination, structural defects, and limited aspect ratios, particularly in top-down approaches and self-organized growth methods.

Innovation Solution

A top-down method involving selective thermal evaporation of uncovered regions in a multilayer structure using a self-organized mask within an epitaxy reactor, allowing for precise control of nanostructure dimensions and minimizing contamination by performing all steps in a single reactor.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If bottom-up epitaxial growth with metal catalyst is used, then nanostructures can be produced, but metal contamination of the nanostructure occurs

Engineering Contradiction:
Improveease of producing nanostructuresVSAvoidmetal contamination
Core Design Contradiction:
Ease of manufactureVSObject-affected harmful factors

Solution Approach 1:

The invention removes the metal catalyst from the nanostructure production process entirely. Instead of using catalyst-assisted epitaxial growth, the method employs direct epitaxial growth to form nanowires and quantum dots, thereby eliminating the source of metal contamination while maintaining the ability to produce nanostructures with controlled dimensions and crystalline quality

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The invention introduces a dielectric mask as an intermediary element to enable precise positioning and size control of nanostructures without requiring metal catalysts. The mask patterns are formed by lithography and serve as templates that guide epitaxial growth, allowing controlled nucleation and growth of nanostructures at specific locations while avoiding catalyst contamination

Inventive Principle:
Principle #24Intermediary (Mediator)

2Object-affected harmful factors

If self-organized growth without catalyst is used, then metal contamination is avoided, but structural defects and orientation problems occur

Engineering Contradiction:
Improvemetal contaminationVSAvoidstructural defects and orientation control
Core Design Contradiction:
Object-affected harmful factorsVSManufacturing precision

Solution Approach 1:

The invention performs preliminary patterning of dielectric mask layers using lithography before initiating epitaxial growth. These pre-formed mask patterns serve as templates that guide the nucleation and growth of nanowires, ensuring correct orientation, uniform spacing, and consistent dimensions. The preliminary mask formation eliminates the need for catalyst-mediated self-organization while providing precise structural control

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention replaces the mechanical/catalytic self-organization mechanism with a lithographically-defined template system. Instead of relying on catalyst particles to nucleate and orient nanowires, the method uses patterned dielectric masks that physically guide growth through epitaxial overgrowth, transitioning from catalyst-driven self-organization to template-directed growth with superior precision

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Manufacturing precision

If dielectric mask deposition is added to control size and position, then manufacturing precision improves, but process complexity and contamination risk increase

Engineering Contradiction:
Improvecontrol of size and positionVSAvoidnumber of deposition equipment
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The invention makes the epitaxial reactor multi-functional by enabling it to perform both dielectric mask deposition and semiconductor nanowire growth within the same chamber. The reactor is equipped with capabilities to deposit dielectric materials (such as silicon dioxide or silicon nitride) followed by semiconductor epitaxial growth, eliminating the need for separate deposition equipment and reducing contamination risks from sample transfer between chambers

Inventive Principle:
Principle #6Universality (Multi-functionality)

4Manufacturing precision

If top-down etching approach is used, then precise dimensions can be achieved, but maintaining vertical flanks on large thicknesses is difficult

Engineering Contradiction:
Improvedimensional controlVSAvoidvertical flanks and aspect ratio
Core Design Contradiction:
Manufacturing precisionVSShape

Solution Approach 1:

The invention inverts the conventional top-down etching approach by using bottom-up epitaxial growth to achieve precise dimensional control. Instead of etching away material to define nanostructure dimensions, the method grows nanowires from patterned mask templates, allowing precise control of diameter (determined by mask pattern) and length (controlled by growth time and rate). This growth-based approach naturally maintains vertical flanks and achieves high aspect ratios that are difficult to obtain through etching

Inventive Principle:
Principle #13The other way round (Inversion)

5Ease of manufacture

If stress relief technique is used to produce quantum dots, then quantum dots can be formed, but aspect ratio is limited below 1 and diameter is very variable

Engineering Contradiction:
Improveformation of quantum dotsVSAvoidaspect ratio and diameter control
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The invention applies local quality control by using patterned dielectric masks with specific geometries (such as circular, rectangular, or triangular patterns) to define the nucleation sites and growth characteristics of quantum dots. The mask pattern dimensions, spacing, and shape directly control the final quantum dot diameter and aspect ratio, enabling precise and uniform quantum dot formation with aspect ratios greater than 1, unlike stress relief methods that produce variable-sized dots with aspect ratios below 1

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables the production of nanostructures with well-controlled dimensions, high aspect ratios, and reduced impurities, particularly nanowires with diameters below 10 nm and quantum dots without a wetting layer, facilitating their integration into an epitaxial matrix with improved crystalline quality and purity.

Implementation Method 1

partially covering a surface of a single-crystal layer or multilayer structure with a discontinuous mask, forming discrete islets having at least one submicrometric lateral dimension and made of a material having an evaporation temperature above that of said layer or multilayer structure

Methodology Applied
Scientific EffectPhysical barrier protection:

Implementation Method 2

heating said layer or multilayer structure under vacuum to a so-called etching temperature, above the evaporation temperature of said layer or multilayer structure but below that of said mask, so as to cause evaporation of said layer or multilayer structure outside of the regions covered by said mask

Methodology Applied
Scientific EffectThermal evaporation: Evaporation

Data Source

PatentUS11085130B2Method for producing nanostructures
Publication Date: 2021.08.10 CENT NAT DE LA RECH SCI (C N R S)
  • US11085130B2 patent drawing
  • US11085130B2 patent drawing
  • US11085130B2 patent drawing

AI summary

A method for producing at least one type of nanostructures comprises the following steps: partially covering a surface of a single-crystal layer or multilayer structure with a discontinuous mask, forming discrete islets having at least one submicrometric lateral dimension and made of a material having an evaporation temperature above that of the layer or multilayer structure; and heating the layer or multilayer structure under vacuum to a so-called etching temperature, above the evaporation temperature of the layer or multilayer structure but below that of the mask, so as to cause evaporation of the layer or multilayer structure outside of the regions covered by the mask. Structures that may be produced by such a method are also provided.