Non-contact Probe Positioning for NDT Systems

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Solution Overview

Problem

Non-destructive inspection systems lack the ability to track the precise location of probes relative to test structures without the complexity of positioning devices, limiting their utility in field service applications.

Innovation Solution

A method and system that utilize electronic cameras to non-contactly determine the location of probes relative to test structures, generating a location data stream, and associate test data with the probe's position, enabling accurate and portable inspection without the need for additional positioning equipment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a positioning device (scan bridge, x-y gantry, R-theta arm) is used to track probe location, then measurement precision of probe position is improved, but device complexity increases

Engineering Contradiction:
Improveprobe position tracking accuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts the positioning function from a complex mechanical positioning device and implements it through a separate electronic camera system that independently captures probe location data, eliminating the need for scan bridges, x-y gantries, or R-theta arms

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent replaces the mechanical positioning system with an optical measurement system using electronic cameras to capture probe position and test structure position, converting mechanical coordinate tracking into optical image-based position determination

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If a positioning device is integrated into the non-destructive inspection system, then probe location tracking capability is improved, but ease of operation deteriorates due to additional equipment to store, carry, assemble, and calibrate

Engineering Contradiction:
Improveprobe location trackingVSAvoidfield service capability
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent extracts the positioning functionality from the main inspection system into a separate, independent camera-based system, allowing the inspection probe and positioning cameras to operate independently and be configured flexibly in field service environments

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The electronic camera system serves multiple functions: it tracks probe position, tracks test structure position, and provides visual reference, eliminating the need for separate positioning devices and reducing overall system complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate and portable non-destructive inspection by determining the probe's location and associating test data with the structure, reducing system complexity and enhancing field service capabilities.

Implementation Method 1

non-contact capturing of a position of the probe and non-contact capturing of a position of the test structure

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentEP2869067B1Method and system for non-destructive inspection comprising a position determination
Publication Date: 2022.01.05 THE BOEING CO
  • EP2869067B1 patent drawingFigure 1
  • EP2869067B1 patent drawingFigure 2

AI summary

Disclosed non-destructive inspection methods (100) comprise non-contact determination of the location (101) of a non-destructive inspection probe (30) and identification of the location on a test structure (20) where test data is acquired by the probe (30). Determination may include capturing the positions of the probe (30) and the test structure (20) with one or more electronic cameras. Identification may include associating (104) the acquired test data with the location of the probe (30) relative to the test structure (20). Further, methods may comprise visualization (106) of the test data relative to the identified location (104). Disclosed non-destructive inspection systems (10) comprise a probe (30), one or more electronic cameras, a computer (44), and a display (42), together configured to determine the location (101) of the probe (30), to acquire test data with the probe (30), to identify a location on a test structure (20) associated with the test data, and to visualize (106) the test data in relation to the test structure (20).