Near-field antenna array for rapid wireless device testing
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Solution Overview
Problem
Conventional testing systems for wireless microelectronic assemblies are inefficient, requiring large chambers and hours or days to scan full 3D electromagnetic fields, and can only test a single antenna array at a time, making them unsuitable for small-scale, rapid testing of multiple antenna arrays in devices like computers and wearable electronics.
Innovation Solution
A wireless testing apparatus with an array of antenna elements and electrical switches, where the distance between antenna elements is at least half a wavelength of the test signal, allowing for simultaneous testing of multiple antenna arrays within a near-field region without mechanical rotation, using an RF shielded chamber and processing techniques to convert near-field data to far-field data for evaluation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional testing systems use large chambers to scan full 3D electromagnetic fields, then measurement precision is improved, but testing time increases to hours or days and device complexity increases
Solution Approach 1:
The patent segments the electromagnetic field measurement into near-field and far-field components. By measuring only the near-field electromagnetic field using a compact antenna array, the system avoids the need to scan the entire 3D far-field space, dramatically reducing testing time while maintaining measurement precision through mathematical transformation of the near-field data to obtain far-field radiation patterns.
Solution Approach 2:
The patent replaces the mechanical rotation and physical scanning system with an electrical and mathematical system. Instead of mechanically rotating the DUT or moving the antenna array through large distances to map the far-field, the system uses a compact near-field measurement setup with signal processing algorithms to compute far-field radiation patterns, eliminating mechanical complexity and reducing testing time.
2Measurement precision
If conventional testing systems scan full 3D electromagnetic fields, then measurement precision is improved, but device complexity and chamber size increase
Solution Approach 1:
The patent segments the measurement process into near-field measurement and far-field computation. The physical measurement is limited to the near-field region using a compact antenna array, while the far-field radiation patterns are obtained through mathematical transformation, thereby simplifying the physical testing system while maintaining measurement precision.
Solution Approach 2:
The patent substitutes mechanical scanning and rotation systems with a compact near-field measurement setup combined with signal processing. This replacement eliminates the need for large chambers and mechanical movement mechanisms, reducing device complexity while preserving the ability to obtain accurate far-field radiation patterns.
3Measurement precision
If conventional testing systems test single antenna arrays sequentially, then measurement precision is maintained, but productivity decreases
Solution Approach 1:
The patent merges multiple antenna array measurements into a single integrated near-field measurement process. By positioning multiple antenna arrays in the near-field region and simultaneously capturing their electromagnetic fields, the system can process and transform all measurements to obtain far-field radiation patterns for multiple arrays in parallel, thereby maintaining measurement precision while significantly improving productivity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and rapid testing of wireless communication functionality and performance for small and low-profile applications, such as computers and wearable devices, by capturing electromagnetic field properties in a compact setup, reducing testing time and enabling simultaneous evaluation of multiple antenna arrays.
Implementation Method 1
an array of antenna elements at a first surface of a substrate to receive a test signal from a device under test (DUT)... wherein a distance between the antenna elements and the DUT is within a near-field region
Data Source
AI summary
Devices and methods for testing microelectronic assemblies including wireless communications are disclosed herein. For example, in some embodiments, a wireless testing system may include a radio frequency (RF) shielded chamber; a device under test (DUT) in the RF shielded chamber, wherein the DUT includes an array of first antenna elements; a testing apparatus in the RF shielded chamber including an array of second antenna elements at a first surface of a substrate to receive a test signal from the DUT, wherein a distance between individual second antenna elements and an adjacent second antenna element is at least half of a wavelength of the test signal, and wherein a distance between the first antenna elements and the second antenna elements is within a near-field region; and an array of electrical switches, wherein an individual electrical switch is coupled to a respective individual second antenna element.