Needle Card Chamber for Cryogenic Signal Integrity
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Solution Overview
Problem
High-frequency and low-power electronic device testing faces signal loss due to radiation issues, making it challenging to use needle cards effectively in cryogenic systems.
Innovation Solution
An apparatus with a needle card and an electrically conductive chamber is designed, where the needle card is placed outside the chamber, and contact needles extend through openings to minimize signal loss by optimizing the electromagnetic eigenmode of the chamber, preventing standing wave excitation and using conductive materials like aluminum, copper, or niobium.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If needle cards are used for electrical contact in high-frequency and low-power range, then electrical connection is established, but signal loss occurs due to radiation into the surroundings
Solution Approach 1:
The needle card is extracted from the interior of the cryogenic chamber and placed in the exterior environment. The contact needles extend through openings in the chamber wall to establish electrical contact with electronic devices inside the chamber without allowing signal radiation into the surroundings. This separation of the needle card from the chamber interior eliminates the radiation path while maintaining electrical connectivity.
Solution Approach 2:
The chamber wall with openings acts as an intermediary structure that allows contact needles to transmit electrical signals into the chamber while blocking electromagnetic radiation paths. The openings in the conductive chamber wall serve as a mediator that enables electrical contact without creating radiation pathways for high-frequency signals.
2Reliability
If contact needles are pressed onto electronic devices to create electrical connection, then electrical contact is established, but mechanical stress may damage the fragile bonds
Solution Approach 1:
The mechanical parameters of the contact system are changed by using spring-loaded contact needles that apply controlled, reversible force. The spring mechanism allows the contact needles to maintain consistent electrical contact through thermal expansion and contraction of the substrate while preventing excessive mechanical stress that would damage fragile bonds. The reversible nature of the spring contact allows the system to accommodate dimensional changes without permanent deformation.
3Reliability
If bonding is used to create permanent electrical connections, then electrical contact is established, but the bonds become fragile to mechanical stress
Solution Approach 1:
The permanent mechanical bonding process is replaced with a reversible mechanical contact system using spring-loaded contact needles. Instead of creating permanent bonds that are fragile to mechanical stress, the system uses controlled mechanical pressure from springs to establish electrical contact. This substitution allows the connection to be maintained without the fragility associated with bonded joints, as the spring mechanism can accommodate mechanical variations while maintaining electrical connectivity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration reduces signal loss during testing and operation of electronic devices in the high-frequency and low-power range by ensuring the testing frequency does not excite the chamber's eigenmode, allowing for reliable contact without mechanical stress on the connections.
Implementation Method 1
an electrically conductive chamber surrounding the base surface... The electrically conductive chamber has an electromagnetic eigenmode that is larger than a testing and/or operating frequency supplied to the at least one electronic device
Implementation Method 2
a needle card including at least one contact needle, the at least one contact needle being configured for electrical contact with the at least one electronic device
Data Source
AI summary
The present disclosure relates to an apparatus (100, 200) for testing and/or operating electronic devices (10), preferably inside a cryogenic apparatus (1000). The apparatus (100, 200) includes a base (110) having a base surface (112) configured to have at least one electronic device (10) arranged thereon; an electrically conductive chamber (120) surrounding the base surface (112); and a needle card (130) including at least one contact needle (132), the at least one contact needle (132) being configured for electrical contact with the at least one electronic device (10) for testing and/or operating the at least one electronic device (10).


