Nested Electrode Geometry for Scanning Electron Microscope Ion Drift Reduction

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Solution Overview

Problem

Existing scanning electron microscope (SEM) systems using gas ionization and multiplication for secondary electron image formation face challenges in improving image forming speed and quality due to elongated ion drift time and insufficient ion multiplication ratio, primarily because the prior art does not optimize the shape of the electric field supply electrode and the distance between electrodes effectively.

Innovation Solution

The SEM system incorporates an electric field supply electrode and an ion current detection electrode arranged to cover each other, with the ion current detection electrode having a shape that efficiently detects ions generated near the electric field supply electrode, reducing the drift distance and optimizing the potential gradient for enhanced ion multiplication and detection efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the drift distance of secondary electrons is increased to enhance gas multiplication, then the ion multiplication ratio is improved, but the ion drift time is elongated and response speed deteriorates

Engineering Contradiction:
Improveion multiplication ratioVSAvoidion drift time
Core Design Contradiction:
Quantity of substanceVSLoss of time

Solution Approach 1:

The patent transitions from a linear electrode arrangement to a three-dimensional nested configuration where the ion current detection electrode is positioned inside the electric field supply electrode. This spatial reorganization allows ions to be detected closer to their generation point, reducing drift distance and time while maintaining effective multiplication volume.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The ion current detection electrode is nested within the electric field supply electrode, creating a concentric arrangement. This nesting allows the detection electrode to be positioned in the region where ions are generated through gas multiplication, minimizing the distance ions must travel to be detected while the outer electrode maintains the electric field for multiplication.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Measurement precision

If a dedicated ion current detection electrode separate from sample holder is used, then ion detection efficiency is improved, but device complexity increases

Engineering Contradiction:
Improveion detection efficiencyVSAvoidelectrode configuration complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The electric field supply electrode performs dual functions: it creates the electric field necessary for gas multiplication of secondary electrons and simultaneously serves as the collecting electrode for ions generated during this process. This multi-functionality eliminates the need for a separate ion detection electrode, reducing device complexity while maintaining detection efficiency.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration significantly improves the response speed of the detection system and ion yield, resulting in higher quality SEM images by shortening ion drift time and increasing the ion multiplication ratio, compared to prior art technologies.

Implementation Method 1

Secondary electrons are multiplied in residual gas molecules around, then ionized gas ions are detected

Methodology Applied
Scientific EffectGas ionization: Ionisation

Implementation Method 2

The secondary electrons 18 and the electrons generated by ionization are further accelerated by the electric field generated by the electric field supply electrode 23, again collide with the gas molecules and form the electron-ion pairs. As this process is repeated, the number of electrons and the number of ions increase exponentially

Methodology Applied
Scientific EffectElectron avalanche: Electron Avalanche

Implementation Method 3

The ions drift towards the ion current detection electrode 22 that is electrically connected to the sample holder 16 or is electrically insulated from the sample holder 16. The drifting ions are detected as an ion current.

Methodology Applied
Scientific EffectIon drift:

Data Source

PatentUS7511271B2Scanning electron microscope
Publication Date: 2009.03.31 HITACHI SCIENCE SYSTEMS LTD
  • US7511271B2 patent drawing
  • US7511271B2 patent drawing
  • US7511271B2 patent drawing

AI summary

A scanning electron microscope includes an irradiation optical system for irradiating an electron beam to a sample; a sample holder for supporting the sample, arranged inside a sample chamber; at least one electric field supply electrode arranged around the sample holder; and an ion current detection electrode.