Nested 3D Memory Word Line Contacts for Easier Deep Etching
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Solution Overview
Problem
High aspect ratio word line (WL) contacts in 3D flash memory arrays pose challenges during etching, particularly for deep contacts, as they require precise alignment and can increase memory array size due to constraints on critical dimension (CD) and pitch, making it difficult to add more memory levels without expanding the array's footprint.
Innovation Solution
The integration of nested WL contact structures, where an inner WL contact is embedded within an outer WL contact, isolated by a dielectric or insulating material, allows for increased critical dimension without expanding the array's width or size, facilitating easier etching and faster process times by reducing the aspect ratio of the outer WL contacts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If the number of memory levels is increased, then the storage capacity is improved, but the aspect ratio of WL contacts increases making etching more difficult
Solution Approach 1:
The patent implements nested WL contact structures where inner WL contacts are positioned within outer WL contacts. This nesting arrangement allows multiple contact structures to share a common etching pathway, effectively reducing the aspect ratio that each individual contact must traverse. The inner contacts benefit from the broader opening provided by outer contacts, making etching feasible for deep contacts in high-density 3D memory arrays.
Solution Approach 2:
The patent transitions from a single-dimensional contact approach to a multi-dimensional nested contact architecture. By arranging contacts in nested concentric patterns across multiple dimensions, the design allows deeper contacts to be reached through shared etching paths, effectively distributing the etching burden and reducing the effective aspect ratio for each individual contact.
2Ease of manufacture
If the critical dimension of WL contacts is increased, then the etching ease is improved, but the memory array size increases
Solution Approach 1:
The patent merges multiple WL contact structures into nested configurations where outer contacts provide broader openings that accommodate inner contacts. This merging allows the outer contacts to serve dual purposes: providing structural support and creating enlarged etching pathways for inner contacts. The result is improved etching ease for deep contacts without requiring proportional increases in the overall memory array footprint.
Solution Approach 2:
By nesting contacts within contacts, the patent enables inner contacts to utilize the enlarged opening created by outer contacts. This nesting strategy allows critical dimensions to be effectively increased for deep contacts without expanding the lateral footprint of the memory array, as the nested structure fits within the existing contact envelope.
3Quantity of substance
If the pitch of WL contacts is reduced, then the density is improved, but the alignment precision required increases
Solution Approach 1:
The patent employs preliminary self-aligned formation of nested contact structures. Outer contacts are formed first, establishing reference structures that guide subsequent formation of inner contacts. This sequential, self-aligned approach reduces the need for high-precision independent alignment steps, as each contact is positioned relative to previously formed contacts rather than requiring absolute positioning precision.
Solution Approach 2:
The nested contact structure utilizes self-aligned formation processes where outer contacts automatically define the positioning framework for inner contacts. The structure serves its own alignment function, with each contact level providing reference for the next, thereby reducing dependency on external alignment precision mechanisms and enabling higher density arrangements.
Data Source
AI summary
A memory array including integrated word line (WL) contact structures are disclosed. The memory array comprises a plurality of WLs that includes at least a first WL and a second WL. An integrated WL contact structure includes a first WL contact and a second WL contact for the first WL and the second WL, respectively. The second WL contact extends through the first WL contact. For example, the second WL contact is nested within the first WL contact. An intervening isolation material isolates the second WL contact from the first WL contact. In an example, the second WL contact extends through a hole in the first WL to reach the second WL. The isolation material isolates the second WL contact from sidewalls of the hole in the first WL.


