Dual-Sided Neural Probe Electrode Layout With TSV Signal Routing
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Solution Overview
Problem
Existing electrode arrangements face challenges in connecting arrays of electrodes on opposite surfaces of a substrate to electronic circuitry without causing plasma-induced damage (PID) and in efficiently processing signals from both sides of the substrate for high-quality neural signal recording.
Innovation Solution
The electrode arrangement includes a semiconductor carrier substrate with arrays of electrodes on opposite surfaces, connected through a connecting layer and through-substrate vias (TSVs) to electronic circuitry, allowing for signal processing close to the electrodes while avoiding PID by ensuring electrodes are not connected during plasma etching.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If arrays of electrodes are arranged on opposite surfaces of a substrate and connected to electronic circuitry, then signal recording capability is improved, but plasma-induced damage occurs during manufacturing
Solution Approach 1:
The patent applies preliminary action by forming the electronic circuitry on the substrate before forming the arrays of electrodes on both surfaces. This sequence ensures that when plasma etching is used to create the electrodes, the sensitive electronic circuitry is already in place and protected, eliminating the risk of plasma-induced damage that would occur if electrodes were formed first and then connected to circuitry.
Solution Approach 2:
The patent segments the manufacturing process into distinct stages: first forming the electronic circuitry on the substrate, then forming through-substrate vias to connect to electrodes on both surfaces. This segmentation allows each component to be manufactured and protected independently, with the circuitry established before exposure to plasma processing steps.
2Measurement precision
If electronic circuitry is placed close to electrodes for signal processing, then signal processing quality is improved, but device complexity increases
Solution Approach 1:
The patent merges the electronic circuitry directly with the substrate that also carries the electrode arrays. By integrating the circuitry onto the same substrate as the electrodes rather than using separate components, the design achieves compact signal processing close to the electrodes while avoiding the complexity of additional external processing modules or layers.
Solution Approach 2:
The patent utilizes the third dimension by routing connections through the substrate thickness via through-substrate vias. This allows electronic circuitry to be positioned on one surface while electrodes are accessed from both surfaces, enabling compact three-dimensional integration that reduces overall device complexity compared to planar arrangements.
3Ease of manufacture
If through-substrate vias are used to connect electrodes on opposite surfaces to circuitry, then manufacturing simplicity is improved, but device complexity increases
Solution Approach 1:
The through-substrate vias serve multiple functions: they provide electrical connections from electrodes on both front and back surfaces to the electronic circuitry, and they enable the substrate to act as an integrated platform for both mechanical support and electrical interconnection. This multi-functionality simplifies manufacturing by eliminating the need for separate bonding layers or additional interconnection structures.
Data Source
Figure 1~2
Figure 3~4b
Figure 4c~4e
AI summary
An electrode arrangement (100; 200) comprises: a semiconductor carrier substrate (102; 202) having a first (104; 204) and a second side surface (106; 206); a first array of electrodes (110; 210) arranged above the first side surface (104; 204); a second array of electrodes (120; 220) arranged below the second side surface (106; 206); an electronic circuitry (130; 230) for processing electrical signals recorded by the electrodes (110, 120; 210, 220); a connecting layer (140 240) arranged above the electronic circuitry (130; 230) and providing a first connection (142a; 242a) between a first point (144a; 244a) and a second point (144b; 244b); a first interconnect (146; 246) for electrically connecting the first point (144a; 244a) to the electronic circuitry (130; 230); a second interconnect (148; 248) and a first through-substrate via (150; 250) which electrically connect the second point (144b; 244b) to the electrode (120; 220) in the second array.