Neural-Network Processing Tool Control for Stable Semiconductor Yield

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Solution Overview

Problem

Semiconductor processing tools experience performance degradation between preventive maintenance cycles, leading to reduced quality and yield in electronic device manufacturing, and varying performance across tools of similar functionality, resulting in decreased production efficiency.

Innovation Solution

Implementing an intelligent processing tool that uses an artificial neural network to monitor and adjust key parameters in real-time, learning from R&D and production data to maintain consistent performance without frequent maintenance, ensuring identical performance across matching tools.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If preventive maintenance is performed periodically on semiconductor processing tools, then reliability is improved, but productivity deteriorates due to downtime and recovery time

Engineering Contradiction:
Improveprocessing tool reliabilityVSAvoidproduction throughput
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The system performs preliminary actions by continuously monitoring processing parameters and predicting tool performance degradation before it occurs. The neural network model forecasts future tool states and schedules maintenance only when necessary, preventing unexpected failures while avoiding unnecessary maintenance interruptions to production

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system implements feedback by continuously monitoring processing parameters, comparing actual performance against predicted performance using neural network models, and automatically adjusting operational parameters or scheduling maintenance based on the deviation. This closed-loop feedback ensures reliability while minimizing productivity impact by only intervening when actually needed

Inventive Principle:
Principle #23Feedback

2Productivity

If processing tools are operated continuously between maintenance cycles, then productivity is improved, but manufacturing precision deteriorates as performance degrades

Engineering Contradiction:
Improveproduction throughputVSAvoiddevice fabrication quality
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The system continuously monitors processing parameters and compares them against neural network predictions of optimal performance. When deviations indicate quality degradation, the system provides feedback to adjust operational parameters or trigger maintenance, ensuring manufacturing precision is maintained while maximizing continuous operation time between maintenance cycles

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system dynamically adjusts operational parameters in real-time based on neural network predictions of tool performance degradation. By continuously adapting process parameters to compensate for tool wear and drift, the system maintains manufacturing precision throughout extended operation periods between maintenance cycles

Inventive Principle:
Principle #15Dynamics

3Manufacturing precision

If artificial neural network parameter adjustment is implemented, then manufacturing precision is improved, but device complexity increases

Engineering Contradiction:
Improveprocessing performance consistencyVSAvoidsystem complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The system introduces an intermediary neural network software layer that sits between the processing tool and control system. This intermediary model translates complex tool performance data into simple maintenance recommendations and parameter adjustments, improving precision without requiring complex hardware modifications to the actual processing tool

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS11209804B2Intelligent processing tools
Publication Date: 2021.12.28 APPLIED MATERIALS INC
  • US11209804B2 patent drawing
  • US11209804B2 patent drawing
  • US11209804B2 patent drawing

AI summary

One or more first parameters associated with an electronic device manufacturing process are monitored. An artificial neural network associated with the one or more first parameters is determined. One or more second parameters are determined using the artificial neural network. The one or more first parameters are adjusted using the one or more second parameters.