Non-abrasive Test Fixture for Neuromodulation Electrode Continuity
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Solution Overview
Problem
Conventional methods for testing electrode continuity in neuromodulation devices, such as using a multimeter and probes, can damage the electrode surface, compromising its functionality.
Innovation Solution
A test fixture with non-abrasive conductive materials, like conductive foam or smooth metal pads, is used to establish electrical continuity with electrodes, reducing pressure and preventing damage during testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional multimeter probes are used to measure electrode continuity, then electrical continuity can be tested, but the electrode surface may be damaged
Solution Approach 1:
A non-abrasive conductive material is introduced as an intermediary between the multimeter probe and the electrode surface. This intermediate layer allows electrical contact to be established while preventing direct mechanical contact that would cause surface damage, thus resolving the contradiction between achieving electrical continuity measurement and preventing electrode surface damage
Solution Approach 2:
The non-abrasive conductive material is designed as a consumable test element that can be easily replaced. Rather than risking damage to the expensive electrode, a cheaper disposable conductive interface is used to establish electrical contact, allowing continuity testing without compromising the electrode's long-term functionality
2Reliability
If pressure is applied to establish electrical contact during testing, then good electrical continuity is achieved, but the electrode surface may be compromised
Solution Approach 1:
The non-abrasive conductive material serves as a mediator that can be compressed to establish reliable electrical contact while protecting the electrode surface from direct pressure. This intermediate layer absorbs the mechanical stress, allowing good electrical continuity to be achieved without compromising the electrode's structural integrity or surface properties
Solution Approach 2:
The test fixture changes the physical parameters of the contact interface by using a compliant, non-abrasive material that can deform under pressure. This allows the contact pressure to be distributed over a larger area and controlled to achieve reliable electrical contact while staying below the threshold that would damage the electrode surface
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for effective electrical continuity testing of neuromodulation device electrodes without damaging the surface, ensuring the electrodes' functionality is preserved for pre-implantation screening.
Implementation Method 1
the non-abrasive conductive pads are formed of a conductive foam that provides a normal force against the electrodes when slightly compressed to establish and maintain electrical contact
Implementation Method 2
the non-abrasive conductive pads are formed of a conductive foam that provides a normal force against the electrodes when slightly compressed to establish and maintain electrical contact
Data Source
AI summary
A test fixture (20) for testing continuity in at least one electrode of a neuromodulation device. The test fixture may comprise a substrate (22), at least one electrically conductive pad (24a) disposed on the substrate for reducing pressure applied to the at least one electrode when the electrically conductive pad makes contact with an exposed surface of the electrode, and a wire (26a) extending from the at least one electrically conductive pad. The pad may be formed of a non-abrasive material, such as conductive foam or smooth metal. The substrate may be a probe formed with a number of slots for holding pads and routing wires, a mandrel with openings for holding pads and routing wires, and a flexible circuit with exposed smooth metal surfaces. The test fixture may be suitable for testing cuff-like and paddle-like devices.