Neutral Atom Imaging Unit Modulation Grid

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Solution Overview

Problem

The development of space neutral atom detection technology is hindered by the extremely strong extreme ultraviolet/ultraviolet radiation in space, which severely affects the accuracy and reliability of energetic neutral atom (ENA) measurements, leading to a significant reduction in detected neutral component flux.

Innovation Solution

A neutral atom imaging unit comprising a semiconductor detector line array and a modulation grid that performs Fourier transform on incident neutral atoms, with adjustable slit and slat widths, and a collimation-and-deflection module to filter out charged particles, allowing for high temporal and spatial resolution imaging without being affected by UV radiation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a diffraction filter is added to filter out EUV/UV background radiation, then the ratio of ENA to EUV/UV photons is increased, but the flux of neutral components is reduced by 20 times

Engineering Contradiction:
ImproveENA detection accuracyVSAvoidneutral component flux
Core Design Contradiction:
Measurement precisionVSQuantity of substance

Solution Approach 1:

The patent introduces a grid imaging unit as an intermediary component between the ENA source and the detector. This grid structure with adjustable slit widths acts as a spatial filter that allows neutral atoms to pass through while blocking EUV/UV photons, thereby mediating the conflict between maintaining flux and achieving measurement precision

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent employs parameter changes by making the slit widths of the modulation grid adjustable. By changing the slit width parameter, the system can optimize the balance between allowing sufficient neutral atom flux through while maintaining the ability to filter out background radiation, thus resolving the contradiction between quantity and precision

Inventive Principle:
Principle #35Parameter changes

2Device complexity

If traditional ENA detectors are used, then the device structure is simple, but the detectors are seriously affected by ultraviolet radiation and cannot obtain scientifically valuable detection results

Engineering Contradiction:
Improvedetector structureVSAvoiddetection reliability under UV radiation
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The grid imaging unit serves as a protective intermediary that filters harmful UV radiation before it reaches the detector, allowing the use of relatively simple detector structures while maintaining high reliability under space UV radiation conditions

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces traditional mechanical filtering methods with a grid-based optical system that uses diffraction and interference principles to achieve radiation filtering, thereby maintaining structural simplicity while improving reliability

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Quantity of substance

If the slit width of the modulation grid is increased to improve neutral atom flux, then the spatial resolution of the imaging is degraded

Engineering Contradiction:
Improveneutral atom fluxVSAvoidspatial resolution
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The patent applies dynamics by making the slit widths of the modulation grid adjustable rather than fixed. This allows the system to dynamically optimize the slit width parameter based on the specific detection requirements, enabling the user to balance between neutral atom flux and spatial resolution depending on the observational needs

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The adjustable slit width design gives the modulation grid multiple functions: it can operate in a high-flux mode with wider slits for faint source detection, and in a high-resolution mode with narrower slits for detailed spatial structure analysis, making the system universally applicable to different observational scenarios

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enhances the imaging efficiency and spatial resolution of neutral atoms, reduces the energy threshold for detection, and ensures sufficient neutral atom flux for imaging, overcoming the limitations of traditional ENA detectors.

Implementation Method 1

the modulation grid performs Fourier transform on the incident neutral atom

Methodology Applied
Scientific EffectFourier transform:

Implementation Method 2

Energetic Neutral Atoms (ENA) are generated during the charge exchange process between ring current ions and geocorona hot particles

Methodology Applied
Scientific EffectCharge exchange:

Data Source

PatentUS11662484B2Neutral atom imaging unit, neutral atom imager, neutral atom imaging method, and space detection system
Publication Date: 2023.05.30 PEKING UNIV
  • US11662484B2 patent drawing
  • US11662484B2 patent drawing
  • US11662484B2 patent drawing

AI summary

The present disclosure provides a neutral atom imaging unit, a neutral atom imager, a neutral atom imaging method, and a space detection system. The neutral atom imaging unit includes at least one set of detection units, the at least one set of detection units includes: at least one semiconductor detector line array, each semiconductor detector line array includes a semiconductor detector strip composed of a plurality of semiconductor detectors; and at least one modulation grid. The modulation grid includes a slit and a slat forming the slit; the modulation grid includes a plurality of grid periods, each of the grid periods includes n slits, the width of the semiconductor detector strip is d, and the width (wi) of the i-th slit of the modulation grid satisfies the following relationship:wi=ni×d.