Backlash Detection Using Neutron Bragg Diffraction
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Solution Overview
Problem
Current backlash detection methods in mechanically driven systems lack the precision required for high-accuracy applications, particularly in industrial fields like robotics and precision control, as they can only detect backlash in the unit of minutes, which is insufficient for sub-arcsecond or sub-nanometer resolution.
Innovation Solution
The apparatus and method utilize a neutron or X-ray beam to detect backlash by employing a Bonse-Hart monochromator and analyzer setup, where a detector measures rocking curves during both forward and reverse rotations to quantify backlash in sub-arcsecond or sub-nanometer units, allowing for precise measurement of gear systems and driving units.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional backlash detection methods (torque, rotation angle, laser interferometer) are used, then the detection process is simple, but the measurement precision is insufficient (only minute-level resolution)
Solution Approach 1:
The patent replaces conventional mechanical and optical measurement systems (torque sensors, rotation angle encoders, laser interferometers) with a neutron scattering-based detection system. The neutron beam interacts with the gear teeth through nuclear scattering, allowing direct measurement of positional deviations at the sub-arcsecond level, thereby achieving high precision without complex mechanical measurement chains
Solution Approach 2:
The patent introduces a neutron beam as an intermediary medium to detect backlash. The neutron beam passes through the gear system and detects positional information through scattering patterns, serving as a non-contact intermediary that transfers mechanical backlash information into measurable signal variations without requiring direct mechanical contact or complex sensor arrays
2Measurement precision
If higher precision is required for sub-arcsecond or sub-nanometer backlash detection, then measurement accuracy improves, but the detection system becomes more complex and less accessible
Solution Approach 1:
The patent changes the fundamental detection parameter from mechanical quantities (torque, rotation angle) or optical quantities (laser interference patterns) to neutron scattering intensity and angular distribution. This parameter transformation enables sub-arcsecond resolution by exploiting the wave nature of neutrons and their interaction with atomic nuclei, providing a new measurement dimension that achieves higher precision
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables precise backlash detection in sub-arcsecond or sub-nanometer units, enhancing positional control and reproducibility in precision control fields, contributing to improved mechanical tool and electronics development by minimizing errors and optimizing driving speed and step control.
Implementation Method 1
a monochromator comprising Si crystals for Bragg-diffracting a beam
Implementation Method 2
using the radiation beam such as a neutron or an X-ray
Implementation Method 3
using the radiation beam such as a neutron or an X-ray
Data Source
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AI summary
The backlash detecting apparatus comprises: a monochromator (20) for Bragg-diffracting the incident beam (N1); an analyzer (40) on which the beam diffracted by the monochromator is incident and which Bragg-diffracts the incident beam; a controller (60) for controlling the driver (50) connected to the monochromator (20) or the analyzer (40), so as to rotate the monochromator (20) or the analyzer (40) in a first direction and in a second direction opposite to the first direction; and a detector (70,80) for detecting the beam diffracted (N2) by the analyzer (40) or transmitted (N3) through the analyzer (40) while the monochromator (20) or the analyzer (40) is rotating and measuring a backlash of the driver (50). The backlash detecting apparatus can measure backlash to sub-arcsecond or sub-nanometer precision by using a radiation beam such as a neutron beam, an X-ray beam or the like.