Neutron Activation for Trace Contaminant Identification in ICs
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Solution Overview
Problem
Identifying contaminants in integrated circuits is challenging due to their low levels and the destructive nature of existing extraction processes, which can be time-consuming and expensive, especially for very low concentrations of contaminants that affect the reliability of the circuits.
Innovation Solution
A system that uses a neutron generator to convert atomic elements in integrated circuits into radioactive isotopes, causing upsets in memory cell binary states, which are then analyzed to identify the contaminant through measuring the rate of radioactive decay and half-life of the isotopes produced.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If extraction processes are used to identify contaminants, then identification accuracy is improved, but the integrated circuit is destroyed and the process becomes time-consuming and expensive
Solution Approach 1:
The patent replaces physical extraction processes with neutron radiation-based detection. Instead of mechanically extracting contaminants for analysis, the system uses neutron generators to irradiate the integrated circuit, causing radioactive isotopes to form in contaminants. The decay of these isotopes is detected through upsets in memory cell binary states, enabling non-destructive identification of contaminants while maintaining identification accuracy.
Solution Approach 2:
The patent introduces neutron radiation and radioactive isotopes as intermediaries in the detection process. Neutrons serve as the intermediary that interacts with contaminants to create radioactive isotopes, which then serve as intermediaries that emit detectable radiation during decay. This intermediary approach enables indirect detection of contaminants without direct physical extraction or destruction of the integrated circuit.
2Measurement precision
If conventional analysis methods are used, then contaminant identification is achieved, but the process is time-consuming and expensive
Solution Approach 1:
The patent performs preliminary activation of contaminants by exposing the integrated circuit to neutron radiation before actual detection. This preliminary action converts stable isotopes in contaminants into radioactive isotopes with known half-lives, preparing them for subsequent detection. By pre-activating the contaminants, the system eliminates time-consuming extraction and preparation steps that would otherwise be required during the analysis phase.
Solution Approach 2:
The patent utilizes periodic measurement of memory cell upsets over time to detect radioactive decay patterns. By periodically reading the memory cells at different time points after neutron irradiation, the system captures the exponential decay curve of radioactive isotopes. This periodic action enables automatic identification of contaminants based on their characteristic half-lives, significantly reducing analysis time compared to conventional methods.
3Measurement precision
If very low levels of contaminants are detected using conventional methods, then identification is achieved, but the process becomes especially difficult and expensive
Solution Approach 1:
The patent replaces complex chemical extraction and analysis equipment with a relatively simple neutron generator and memory cell-based detection system. The neutron generator produces neutron flux that activates trace contaminants, and the integrated circuit's own memory cells serve as the detection instrument. This substitution eliminates the need for sophisticated mass spectrometers or other complex analytical equipment, making trace contaminant detection more accessible and cost-effective.
Solution Approach 2:
The patent makes the integrated circuit self-detecting by using its own memory cells to sense radioactive decay from contaminants. The memory cells that are part of the integrated circuit itself serve as the detection mechanism, eliminating the need for external complex detection equipment. The circuit essentially detects its own contamination through neutron-induced radioactive decay, simplifying the overall system while maintaining high sensitivity for trace contaminant detection.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for non-destructive identification of trace contaminants in integrated circuits, providing a cost-effective and efficient means to determine the source of contamination, enabling reliable operation by accurately measuring the half-life of the radioactive isotopes produced.
Implementation Method 1
A neutron generator generates neutrons that convert a portion of the atomic element into a radioactive isotope of the atomic element
Implementation Method 2
A byproduct from the radioactive decay of the radioactive isotope causes upsets of the binary states of the memory cells
Data Source
AI summary
Systems and methods are provided for identifying an atomic element in proximity to an integrated circuit. Trace amounts of a contaminant are identifiable. The atomic element is exposed to neutron radiation to convert a portion of the atomic element into a radioactive isotope of the atomic element. Upsets are measured for the binary states of the memory cells of the integrated circuit during a time period following the exposure to the neutron radiation. The atomic element is identified from the upsets of the binary states of the memory cells of the integrated circuit.