NIR Resin Layer Measurement for Real-Time Multi-Parameter Control
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Solution Overview
Problem
Existing methods for determining multiple parameters of resin layers in carrier materials, such as resin-impregnated paper layers, are time-consuming and inefficient, often requiring manual measurements and leading to increased production downtime and material loss, especially in fast-running systems.
Innovation Solution
A method using Near Infra-Red (NIR) spectroscopy with a multi-measuring head to simultaneously determine parameters like resin layer quantity, degree of curing, moisture content, and abrasion resistance by analyzing NIR spectra, combined with multivariate data analysis, enabling real-time, non-contact measurement and plant control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple parameters are determined using traditional manual or individual automatic measuring methods, then measurement completeness is improved, but measurement time and production downtime increase significantly
Solution Approach 1:
The patent combines multiple individual measuring methods into a single integrated NIR measuring system that simultaneously determines multiple parameters (resin content, moisture, cross-linking degree, etc.) through one measurement process, eliminating the need for separate manual or automatic measurements for each parameter
Solution Approach 2:
The NIR measuring system is designed as a universal device capable of determining multiple different parameters of the resin layer through a single measurement, making the measuring system multi-functional and applicable to various parameter types without requiring separate specialized equipment for each parameter
2Ease of operation
If manual measurement methods are used to determine resin layer parameters, then measurement flexibility is improved, but productivity and production speed are significantly reduced
Solution Approach 1:
The patent replaces manual mechanical measurement methods with an automated optical NIR measurement system that can rapidly determine multiple parameters without human intervention, maintaining measurement flexibility while dramatically improving production speed and productivity
3Extent of automation
If individual parameters are determined separately using NIR measurement, then measurement automation is improved, but the complexity of controlling multiple parameters simultaneously increases
Solution Approach 1:
The patent merges multiple separate parameter determination systems into a single integrated control approach where one NIR measurement system provides data for multiple parameters, and the control system processes all parameters simultaneously through unified control logic, reducing overall system complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Facilitates rapid, multi-parameter determination without reducing production speed, improving plant control, reducing downtime, and enhancing product quality through immediate data availability and AI-assisted process optimization.
Implementation Method 1
by recording and evaluating at least one NIR spectrum in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, more preferably between 900 nm and 1700 nm, using at least one NIR measuring head
Data Source
AI summary
Provided is a method for the simultaneous determination of parameters, in particular, of at least two, three, or four parameters, of at least one resin layer applied to at least one carrier material by recording and evaluating at least one Near Infra Red (NIR) spectrum in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, more preferably between 900 nm and 1700 nm, and particularly advantageously between 1450 nm and 1550 nm, using at least one NIR measuring head, in particular at least one NIR multimeter head.

