Nitride Semiconductor Light Emitting Device Delta-Doped Layer

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Solution Overview

Problem

Current semiconductor light emitting devices face challenges in improving the conductivity and crystallinity of second conductive type semiconductor layers, which affects the efficiency and performance of nitride semiconductor-based LEDs and laser diodes.

Innovation Solution

The implementation of delta-doped layers using second conductive type dopants in the semiconductor light emitting device structure, specifically forming a delta-doped layer on an undoped semiconductor layer, enhances the conductivity and crystallinity of the second conductive type semiconductor layer, thereby improving the device's optical and electrical performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a second conductive type semiconductor layer is formed without delta-doping, then the device structure is simpler, but the conductivity and crystallinity are insufficient

Engineering Contradiction:
Improveconductivity and crystallinityVSAvoidlayer structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies local quality by forming a delta-doped layer only in specific regions where conductivity enhancement is needed, rather than uniformly doping the entire semiconductor layer. This localized doping approach improves conductivity and crystallinity in critical areas while maintaining structural simplicity elsewhere, thus resolving the contradiction between reliability improvement and device complexity.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent changes the doping parameter by introducing a delta-doped layer with specific dopant concentration and depth control. This parameter modification enables precise control over conductivity and crystallinity in the second conductive type semiconductor layer, achieving improved reliability without requiring complete structural redesign.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If delta-doped layers are formed to improve conductivity, then hole concentration increases, but manufacturing process becomes more complex

Engineering Contradiction:
Improvehole concentrationVSAvoidmanufacturing process
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent applies preliminary action by forming the delta-doped layer during the semiconductor layer growth process itself, rather than as a separate post-processing step. This integration of doping into the growth process achieves the desired hole concentration while minimizing additional manufacturing complexity, as the doping occurs concurrently with layer formation.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The use of delta-doped layers increases hole concentration, reduces operating voltage, and enhances the inner quantum efficiency and crystallinity of the semiconductor light emitting device, leading to improved optical characteristics and efficiency.

Implementation Method 1

forming a delta-doped layer on an undoped semiconductor layer... increases hole concentration

Methodology Applied
Scientific EffectDopant diffusion: Diffusion

Data Source

PatentUS9040954B2Semiconductor light emitting device and method for manufacturing the same
Publication Date: 2015.05.26 FAIRLIGHT INNOVATIONS LLC
  • US9040954B2 patent drawing
  • US9040954B2 patent drawing
  • US9040954B2 patent drawing

AI summary

A semiconductor light emitting device includes a first nitride semiconductor layer, a dopant doped semiconductor layer on the first nitride semiconductor layer, an active layer on the dopant doped semiconductor layer, a delta doped layer on the active layer, a superlattice structure on the delta doped layer, an undoped layer on the superlattice layer, a second nitride semiconductor layer including a first n-type dopant, a third nitride semiconductor layer including a second n-type dopant, and a fourth nitride semiconductor layer including a third n-type dopant.