Noise Detection Circuit for WAT-Limited IC Testing
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Solution Overview
Problem
Integrated circuit (IC) testing is challenging due to equipment limitations and specific device requirements, particularly in Wafer Acceptance Test (WAT) platforms where the clock signal frequency is limited to 10 MHz and spectrum analyzers are forbidden, necessitating the development of a noise detecting system that can overcome these obstacles.
Innovation Solution
A noise detecting system comprising an amplifier circuit, filtering circuit, and comparing circuit, integrated with an analyze device and clock generator, which detects noise levels by amplifying, filtering, and comparing input signals to derive noise levels, specifically designed for operational transconductance amplifiers (OTAs) and other circuits within the WAT platform, using a GSG probe card and adhering to the frequency constraints.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional testing equipment is used in WAT platform, then standard IC testing procedures can be performed, but noise level detection is impossible due to equipment limitations and forbidden spectrum analyzers
Solution Approach 1:
The patent introduces an intermediary noise detecting circuit that includes an amplifier circuit, filtering circuit, and comparing circuit. This intermediary device bridges the gap between the limited WAT platform equipment and the need for noise level detection, enabling measurement without requiring forbidden spectrum analyzers by using available components in a creative configuration
Solution Approach 2:
The patent replaces the need for complex external testing equipment with an integrated electronic measurement system built from basic circuit components. By substituting the mechanical/electronic spectrum analyzer requirement with an electronic measurement approach using amplifiers, filters, and comparers, the system achieves noise detection within the constraints of the WAT platform
2Measurement precision
If spectrum analyzers are used for noise detection, then accurate noise levels can be measured, but this is forbidden in WAT platform due to equipment limitations
Solution Approach 1:
The patent changes the measurement parameters and approach by using voltage amplification and filtering instead of frequency-domain analysis required by spectrum analyzers. The system measures noise levels by amplifying the input signal, filtering it through specific frequency ranges, and comparing the filtered signal to reference levels, thereby achieving noise measurement through parameter transformation compatible with WAT platform constraints
Solution Approach 2:
The noise detecting circuit is designed to be universally applicable within the WAT platform by using standard electronic components that can function in multiple roles. The amplifier circuit can amplify various signals, the filtering circuit can select different frequency ranges, and the comparing circuit can reference different voltage levels, making the system versatile and adaptable to different testing scenarios without requiring specialized equipment
Data Source
AI summary
A noise detecting circuit including an amplifier circuit amplifying an input signal indicating a noise level of a circuit to be detected and output an amplified signal; a filtering circuit receiving and filtering the amplified signal and output a filtered signal; and a comparing circuit receiving and compare the filtered signal to a reference voltage and output an output signal; wherein the filtering circuit includes: an output terminal; and a first filter selectively coupled to the output terminal, including: a sub-output terminal; a switch selectively coupling the sub-output terminal to the output terminal; a resistor, wherein a terminal of the resistor is coupled to the amplifier circuit and another terminal of the resistor is coupled to the sub-output terminal; and a capacitor, wherein a terminal of the capacitor is coupled to the sub-output terminal and another terminal of the capacitor is coupled to a reference voltage source.