Noise Data Segmentation for Component Abnormality Diagnosis
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Solution Overview
Problem
Existing abnormality diagnosis techniques for devices with multiple components are inefficient, as they require determining the presence of abnormalities for each component individually, leading to a heavier load as the number of components increases.
Innovation Solution
A processing apparatus that extracts and analyzes operational noise data specific to a designated component, reducing the load by focusing on the operating period of critical components and using this data to determine failure states, thereby streamlining the diagnosis process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If abnormality diagnosis is performed for each component individually, then measurement precision is improved, but device complexity increases and productivity decreases
Solution Approach 1:
The patent segments the operational noise data by component operating periods. The processor identifies and extracts noise data corresponding to each component's operation time window, enabling targeted analysis without requiring simultaneous analysis of all components. This segmentation maintains detection precision while reducing the complexity of processing device-level noise data.
Solution Approach 2:
The patent extracts specific component-related noise data from the overall operational noise. By isolating noise data that corresponds to the operating period of a designated component, the system focuses analysis on relevant data portions, improving diagnostic efficiency without sacrificing accuracy in detecting component-level abnormalities.
2Measurement precision
If abnormality diagnosis is performed for each component individually, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent segments the operational noise data by component operating periods. The processor identifies and extracts noise data corresponding to each component's operation time window, enabling targeted analysis without requiring simultaneous analysis of all components. This segmentation maintains detection precision while reducing the complexity of processing device-level noise data.
Solution Approach 2:
The patent extracts specific component-related noise data from the overall operational noise. By isolating noise data that corresponds to the operating period of a designated component, the system focuses analysis on relevant data portions, improving diagnostic efficiency without sacrificing accuracy in detecting component-level abnormalities.
3Measurement precision
If operational noise data for the entire predetermined period is analyzed, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The patent extracts specific component-related noise data from the overall operational noise. By isolating noise data that corresponds to the operating period of a designated component, the system focuses analysis on relevant data portions, improving diagnostic efficiency without sacrificing accuracy in detecting component-level abnormalities.
Solution Approach 2:
The patent performs preliminary identification of component operating periods before analyzing the operational noise data. By pre-segmenting the time period based on component operation schedules, the system prepares extraction targets in advance, reducing the actual processing time required for failure state detection while maintaining comprehensive coverage of relevant noise data.
Data Source
AI summary
A processing apparatus includes a processor configured to: obtain operational noise data for a predetermined period, the operational noise data being obtained in operation of the apparatus which makes noise caused by the operation; in response to detection of an abnormality in the apparatus from the operational noise data, extract, as analysis target data from the operational noise data, data corresponding to an operating period of a designated component that is designated in advance and that is included in the apparatus; and output the extracted analysis target data to a determination unit that determines presence of the failure state of the designated component.


