Noise Source Evaluation Method for Circuit Malfunction Detection
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Solution Overview
Problem
Existing methods for evaluating device malfunctions due to noise sources are inadequate, as they fail to effectively detect and analyze the impact of noise signals on electric circuits, leading to insufficient noise-resistant designs.
Innovation Solution
A method involving the DPI test to obtain malfunction frequency characteristics, internal noise arrival frequency characteristics, and comparing these to identify threshold noise levels causing malfunctions, providing data for improving circuit design and noise resistance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional evaluation methods are used, then the evaluation process is simple, but the detection precision of noise-induced malfunctions is insufficient
Solution Approach 1:
The evaluation method is divided into three distinct steps: obtaining malfunction frequency characteristics, obtaining internal noise arrival frequency characteristics, and comparing these characteristics. This segmentation allows each step to be performed with focused precision, improving overall detection accuracy without overwhelming complexity
Solution Approach 2:
The method performs preliminary characterization of both malfunction thresholds and internal noise levels before making comparisons. By pre-obtaining malfunction frequency characteristics and internal noise arrival frequency characteristics separately, the evaluation can accurately identify when noise causes malfunction without requiring complex real-time analysis
2Reliability
If internal noise characteristics are analyzed, then the reliability of noise-resistant design is improved, but the measurement and analysis complexity increases
Solution Approach 1:
The method uses frequency characteristics as an intermediary to indirectly measure internal noise effects. Instead of directly measuring complex internal noise signals, the approach compares malfunction frequency characteristics with internal noise arrival frequency characteristics, making the measurement process more manageable and reliable
Solution Approach 2:
The comparison between malfunction frequency characteristics and internal noise arrival frequency characteristics provides feedback on whether internal noise is causing malfunctions. This feedback mechanism allows designers to iteratively improve noise-resistant design based on quantitative evidence from the evaluation
Data Source
AI summary
A method of evaluating a device includes a first electric circuit acting as a noise source and a second electric circuit which is likely to malfunction due to a noise signal. The method includes: obtaining malfunction frequency characteristics indicating magnitudes of a threshold noise signal causing malfunction of the second electric circuit; obtaining internal noise arrival frequency characteristics indicating magnitudes of an internal noise signal arriving at the second electric circuit from the first electric circuit; and comparing the malfunction frequency characteristics with the internal noise arrival frequency characteristics.


