Non-contact probe for antenna-incorporated semiconductor testing
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Solution Overview
Problem
Testing antenna-incorporated semiconductor devices in anechoic chambers is costly and requires large spaces, limiting the efficiency and stability of antenna function testing.
Innovation Solution
A non-contact probe system integrated with a movable base body and insulative probe cover that allows for the reception of radio waves from antennas without physical contact, enabling testing without an anechoic chamber and allowing for uniform load application on the antenna.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an anechoic chamber is used for testing antenna function, then measurement precision is improved, but device complexity and cost increase significantly
Solution Approach 1:
The patent extracts the essential function of radio wave absorption from the complex anechoic chamber structure and implements it through a simple probe with absorbing material. The probe is removed from the chamber environment and becomes a standalone testing component, eliminating the need for the entire anechoic chamber infrastructure while maintaining measurement precision.
Solution Approach 2:
The patent replaces the expensive, permanent anechoic chamber structure with a simple, inexpensive probe that can be easily manufactured and replaced. The probe uses basic radio wave absorbing material rather than the complex electromagnetic shield plates and radio wave absorbers required for an anechoic chamber, significantly reducing cost and complexity.
2Measurement precision
If an anechoic chamber is used for testing antenna function, then measurement precision is improved, but the space required and cost increase
Solution Approach 1:
The patent extracts the measurement function from the large anechoic chamber environment and concentrates it into a small handheld probe. This extraction allows the testing to be performed in minimal space while maintaining the essential measurement capabilities that previously required a large controlled environment.
Solution Approach 2:
The patent replaces the space-consuming anechoic chamber with a compact, portable probe that occupies minimal space. The probe's simple construction using basic absorbing material rather than extensive electromagnetic shielding enables accurate testing in a fraction of the space previously required.
3Reliability
If contact pins are used to electrically connect test instrument, then electrical connection is established, but the pressing mechanism blocks radio wave reception area
Solution Approach 1:
The patent segments the testing functions into separate components: electrical connection is handled by contact pins on the probe, while radio wave reception is handled by the antenna portion. This segmentation allows both functions to operate simultaneously without interference, as the pressing mechanism no longer needs to create a conflict between electrical contact and radio wave reception areas.
Solution Approach 2:
The probe serves as an intermediary device that combines both electrical connection capabilities and radio wave reception capabilities in a single integrated tool. This intermediary structure eliminates the need for separate pressing mechanisms and testing antennas, allowing simultaneous electrical testing and antenna function testing without mutual interference.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and reliable testing of antenna functions with improved stability and reduced costs by eliminating the need for anechoic chambers and allowing for uniform load application, facilitating easier mounting and dismounting of semiconductor devices.
Implementation Method 1
a non-contact probe configured to receive a radio wave emitted from the antenna in a state that the non-contact probe is not in contact with the antenna
Data Source
AI summary
A testing device for testing an antenna-incorporated semiconductor device which is integrated with an antenna is provided. The testing device includes a non-contact probe configured to receive a radio wave emitted from the antenna in a state that the non-contact probe is not in contact with the antenna. The testing device may further include a movable base body configured to be lifted and lowered.