Non-Faradaic EIS for Sensor Layer Thickness Measurement

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Solution Overview

Problem

Current methods for measuring properties such as thickness of layers in electrochemical analyte sensors, like continuous glucose monitoring sensors, lack reliability and efficiency, making it difficult to assess device parameters and manufacturing quality.

Innovation Solution

Non-Faradaic Electrochemical Impedance Spectroscopy (EIS) is used to measure impedance characteristics of material layers without the need for fluids, allowing for rapid and non-destructive assessment of properties like thickness, composition, and architecture of material layers in sensors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional electrochemical methods are used to measure material layer properties, then ion diffusion mechanisms can be utilized, but the measurement process becomes complex and requires fluid solutions which add manufacturing complications

Engineering Contradiction:
Improvemeasurement reliabilityVSAvoidmeasurement system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent replaces the traditional electrochemical measurement system that requires ion diffusion in fluid solutions with an electrical impedance spectroscopy system that measures electrical properties directly. This substitution eliminates the need for complex fluid handling and ion diffusion mechanisms, thereby reducing device complexity while maintaining measurement reliability through direct electrical characterization of material layers

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent extracts and removes the fluid solution component from the measurement system. By taking out the requirement for ion-containing solutions and replacing it with dry electrical impedance measurements, the system achieves simpler manufacturing and reduced operational complexity while maintaining the ability to measure material layer properties reliably

Inventive Principle:
Principle #2Taking out (Extraction)

2Manufacturing precision

If conventional measurement methods are used for material layer thickness, then manufacturing processes can continue, but the measurement process is time-consuming and reduces productivity

Engineering Contradiction:
Improvematerial layer thickness measurement precisionVSAvoidmeasurement speed
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent replaces slow conventional measurement methods with electrical impedance spectroscopy, which provides rapid measurements through electrical signal analysis. This substitution enables quick assessment of material layer properties without time-consuming physical measurements, thereby maintaining manufacturing precision while significantly improving productivity and measurement throughput

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If destructive measurement methods are used to assess material properties, then accurate data can be obtained, but the device cannot be used for further manufacturing or testing

Engineering Contradiction:
Improvematerial property measurement accuracyVSAvoiddevice reusability
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent replaces destructive physical measurement methods with non-destructive electrical impedance spectroscopy. By using electrical signals to probe material properties, the system obtains accurate measurement data without physically altering or damaging the device, thereby maintaining measurement precision while preserving device integrity for continued manufacturing and testing operations

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Reliability

If traditional EIS methods are used in solution, then ion diffusion facilitates electron transfer, but the absence of solution results in open circuit conditions with little information

Engineering Contradiction:
ImproveEIS signal qualityVSAvoidmeasurement applicability
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent changes the fundamental operating parameters of EIS by transitioning from solution-based ion diffusion mechanisms to direct electrical impedance measurements in dry conditions. By changing the measurement parameters to work without ion-containing solutions, the system maintains reliable EIS signal quality while expanding applicability to manufacturing environments where fluid handling is impractical or contaminating

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables precise and efficient measurement of material properties, reducing manufacturing variability and improving sensor calibration, with results achievable in under 20 minutes, enhancing the consistency and performance of electrochemical analyte sensors.

Implementation Method 1

electron transfer can occur via electron hopping amongst charged materials in a sample/material (e.g. polymers) in the absence of fluid

Methodology Applied
Scientific EffectElectron hopping:

Implementation Method 2

measuring an output current that results from the application of the voltage potential... using the measured output current to observe impedance characteristics

Methodology Applied
Scientific EffectElectrical impedance: Electrical Impedance Tomography

Implementation Method 3

the overall electrochemical cell has sufficient surface capacitance, electron transfer can occur

Methodology Applied
Scientific EffectCapacitance: Capacitance

Data Source

PatentUS11311215B2Measurement of device materials using non-Faradaic electrochemical impedance spectroscopy
Publication Date: 2022.04.26 MEDTRONIC MINIMED INC
  • US11311215B2 patent drawing
  • US11311215B2 patent drawing
  • US11311215B2 patent drawing

AI summary

The invention includes method and materials designed to measure the material properties (e.g. thickness) of layers of material in a sensor using non-Faradaic EIS (Electrochemical Impedance Spectroscopy) methods. The methods are non-destructive, very sensitive and rapid. Typically in these methods, an AC voltage is applied to the desired material layer while the output current and therefore impedance is measured. This voltage can be applied in multiple frequencies in sweep mode in order to detect both the material and, for example, the thickness of the target material. In this way, EIS allows the characterization of properties of various layers of material disposed in devices such as electrochemical glucose sensors.