Non-Uniform Sampling Spectrometer Signal Processing
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Solution Overview
Problem
Conventional Fourier Transform Spectrometers require precise control of the variable arm, leading to high costs and susceptibility to artifacts due to imperfect sample spacing, limited spectral range, and inability to independently adjust band centers and line shapes.
Innovation Solution
The method employs non-uniform sampling and novel signal processing to extract spectral features without precise arm control, allowing optimal control of spectral spacing and band centers, reducing artifacts and enhancing spectral range and resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If precise control of the variable arm is implemented in conventional Fourier Transform Spectrometers, then measurement precision is improved, but device complexity and construction cost increase
Solution Approach 1:
The patent replaces the mechanical precision control system with a digital signal processing approach. Instead of using complex mechanical feedback systems to control the variable arm position with high precision, the invention uses digital processing of the interferogram to achieve spectral analysis, thereby reducing mechanical complexity while maintaining measurement precision
Solution Approach 2:
The patent changes the approach from controlling physical parameters (arm position precision) to controlling digital parameters (sampling intervals). By using non-uniform sampling at deliberately spaced intervals and processing the interferogram digitally, the system achieves spectral precision without requiring precise mechanical control, thus resolving the contradiction between measurement precision and device complexity
2Device complexity
If conventional sampling methods are used in Fourier Transform Spectrometers, then device complexity is reduced, but spectral range and resolution are limited
Solution Approach 1:
The patent introduces dynamic control of sampling intervals rather than fixed uniform sampling. The sampling intervals are deliberately varied to optimize spectral resolution and range, allowing the system to adapt to different spectral features. This dynamic sampling approach enhances spectral capabilities without significantly increasing device complexity
Solution Approach 2:
The patent changes the sampling parameter from uniform to non-uniform intervals. By using non-uniform sampling at deliberately spaced intervals, the system can achieve superior spectral resolution and extended spectral range. The sampling intervals are adjusted based on the interferogram characteristics, enabling flexible adaptation to different spectral requirements while maintaining manageable system complexity
3Ease of operation
If uniform sampling is used in conventional spectrometers, then ease of operation is maintained, but spectral artifacts are introduced due to imperfect spacing
Solution Approach 1:
The patent converts the potential harm of non-uniform sampling into a benefit. Instead of trying to maintain uniform sampling (which is difficult to achieve perfectly), the invention deliberately uses non-uniform sampling at optimized intervals. This approach eliminates spectral artifacts caused by imperfect uniform spacing while providing superior spectral resolution and range, turning a potential problem into an advantage
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach results in higher performance and lower construction costs, with improved detection of small quantities of targets and reduced noise, offering superior spectral range and resolution compared to conventional systems.
Implementation Method 1
using the interferometer to form an interference pattern resulting from radiation transmitted, reflected, and/or emitted from a particular substance
Data Source
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AI summary
A sensor and method for remotely determining a presence of a particular substance based on spectral data of the particular substance is disclosed. The sensor includes a sampling module configured to detect radiation from a particular substance using an interferometer, wherein the sampling module includes a control module that is configured to guide and measure spacing of samples taken by the sampling module; a focal plane module configured to detect and convert an interference pattern produced by the interferometer into a series of digital samples; a reference spectra modification module configured to modify reference spectra by modifying according to the measured spacing of samples and an instrument line shape of the sampling module; an estimation module configured to receive the converted series of digital samples and transform the non-uniformly spaced digital samples into frequency space using band centers determined from reference spectra as modified by the instrument line shape of the sampling module; a comparison module configured to compare the transformed digital samples against a database of known chemical signatures; and a determination module configured to determine the presence of the particular substance based on the results of the comparison.