Non-contact Circuit Testing via Capacitive Coupling

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Solution Overview

Problem

Conventional testing methods for electrical connections in high-performance integrated assemblies, such as those in the aerospace or defense industry, are costly and time-consuming, and often damage the components due to physical contact.

Innovation Solution

A non-contact circuit testing apparatus that uses a conductive circuit cover to form a parallel plate capacitor with the electrical component, allowing for capacitive coupling and measurement of electrical signals without physical contact.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If contact testing probes are used to test electrical connection components, then measurement precision is improved, but the electrical connection components are damaged due to physical contact

Engineering Contradiction:

Improveelectrical signal measurementVSAvoidsurface degradation

Core Design Contradiction:

Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

A dielectric member is introduced as an intermediary between the testing probe and the electrical connection component. The dielectric member has a first surface that contacts the electrical connection component and a second surface that contacts the testing probe, preventing direct physical contact between the probe and the component while still enabling electrical signal measurement through the dielectric material.

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces the direct mechanical contact system with a capacitive coupling system. Instead of direct electrical contact through the probe, the system uses the dielectric member to create a capacitor where one plate is the electrical connection component, the other plate is the testing probe, and the dielectric material is the capacitor dielectric, enabling measurement without mechanical contact.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If testing is performed after integrated circuit assembly, then complete system performance is verified, but manufacturing time and cost increase

Engineering Contradiction:

Improvesystem performance verificationVSAvoidmanufacturing time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent enables preliminary testing of electrical connection components on the circuit board before the integrated circuit is assembled. By using the non-contact testing method with the dielectric member, manufacturers can verify the integrity of electrical connections, traces, and components on the board itself, allowing defective boards to be identified and replaced before final assembly, thereby reducing rework time and improving overall manufacturing efficiency.

Inventive Principle:

Principle #10Preliminary action

3Measurement precision

If conventional contact testing is used on hard-to-reach locations, then electrical connections can be tested, but accessibility and ease of operation deteriorate

Engineering Contradiction:

Improveelectrical connection testingVSAvoidaccessibility to test points

Core Design Contradiction:

Measurement precisionVSEase of operation

Solution Approach 1:

The dielectric member acts as an extended intermediary that can be positioned between the testing probe and electrical connection components in hard-to-reach locations. The dielectric member's flexible or extendable nature allows it to reach into confined spaces, recesses, or areas with limited accessibility, enabling testing of electrical connections that would be difficult or impossible to access with conventional rigid probes.

Inventive Principle:

Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient and non-destructive testing of electrical connections, reducing the risk of damage and saving time and resources by allowing testing before assembly and at hard-to-reach locations.

Implementation Method 1

Methodology Applied

Scientific EffectCapacitive coupling: Capacitance

Data Source

PatentUS12282041B1Non-contact circuit testing systems and methods

Publication Date: 2025.04.22 CAES SYSTEMS LLC

AI summary

Systems, apparatuses, semiconductor products and methods for circuit testing, specifically non-contact circuit testing are provided that allow for the wireless, non-contact testing of an electrical component. For example, non-contact circuit testing is performed using a non-contact testing apparatus that include a circuit cover with a conductive material and an oscilloscope. The circuit cover is places over an electrical component to form a parallel plate capacitor with electrical component. The parallel plate capacitor is formed with an air dielectric between the electrical component and the circuit cover. An electrical signal is initiated at the electrical component to cause a voltage through the parallel plate capacitor. An oscilloscope probe is used to measure the voltage of the parallel plate capacitor to determine a connectivity of the electrical component without contacting the electrical component.