Nonlinear Gate Separation Structure for Dense Semiconductor Layouts

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Solution Overview

Problem

Existing semiconductor devices face challenges in achieving high integration and low cost while maintaining effective separation and functionality of gate electrodes and active patterns.

Innovation Solution

The semiconductor device incorporates a substrate with active patterns and gate electrodes separated by gate and element separation structures, where the gate separation structures have varying distances from the active patterns to ensure optimal spacing and overlap, enhancing the separation and functionality of the active patterns.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If gate separation structures are used to separate gate electrodes, then gate electrode separation is improved, but device complexity increases

Engineering Contradiction:
Improvegate electrode separationVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The gate separation structure is divided into multiple segments along the first direction, with each segment positioned at different distances from the active pattern. This segmentation allows the structure to provide effective gate electrode separation while maintaining a manageable and fabricatable design.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different segments of the gate separation structure have different distances from the active pattern, creating local variations in the electric field distribution. This local quality approach optimizes the separation effect at different positions without requiring a completely complex overall structure.

Inventive Principle:
Principle #3Local quality

2Reliability

If multiple separation structures are implemented, then separation effectiveness is improved, but manufacturing precision requirements increase

Engineering Contradiction:
Improveseparation effectivenessVSAvoidspacing precision
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The gate separation structure utilizes variations in distance (a geometric parameter) from the active pattern to optimize separation effectiveness. By changing this parameter across different segments, the structure achieves improved separation while the variations can be controlled within standard manufacturing tolerances.

Inventive Principle:
Principle #35Parameter changes

3Adaptability or versatility

If gate separation structures with varying distances are used, then functionality is optimized, but device complexity increases

Engineering Contradiction:
Improvefunctionality optimizationVSAvoidstructure complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The gate separation structure employs asymmetric positioning of its segments relative to the active pattern, with different distances from the active pattern at different locations. This asymmetry optimizes the electric field distribution and separation functionality without requiring overly complex structural arrangements.

Inventive Principle:
Principle #4Asymmetry

Data Source

PatentUS20260032993A1Semiconductor device
Publication Date: 2026.01.29 SAMSUNG ELECTRONICS CO LTD
  • US20260032993A1 patent drawing
  • US20260032993A1 patent drawing
  • US20260032993A1 patent drawing

AI summary

A method of fabricating a semiconductor device, including forming first and second active patterns on a substrate, in which the first and second active patterns are spaced apart, forming gate electrodes on the first and second active patterns, in which the gate electrodes are spaced apart, and forming a non-linear gate separation structure between the first and second active patterns, including a first side facing the second active pattern, and a second side opposite to the first side, a distance from the second active pattern to the first side of a first portion of the non-linear gate separation structure is smaller than a distance to the first side of a second portion of the non-linear gate separation structure, and a distance from the second active pattern to the second side of the first portion is smaller than a distance to the second side of the second portion.