Non-linear Histogram Segmentation for Overlapping Particle Populations

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional particle analysis methods face challenges in accurately differentiating and segmenting overlapping particle populations in 2D histograms due to shifts and overlaps, leading to inconsistent performance, especially in abnormal samples.

Innovation Solution

The method employs 2D digital image processing techniques, including seed detection, anchor point placement, dynamic contouring, and morphological fine tuning, to optimize the segmentation of 2D histograms, treating the histogram as an image and applying filters and thresholding to enhance differentiation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional segmentation methods based on 1D histogram analysis are used, then the process is relatively simple, but the segmentation precision deteriorates when particle populations overlap or shift in 2D histograms

Engineering Contradiction:
Improvesegmentation precisionVSAvoidsegmentation process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent transitions from analyzing one-dimensional histograms to processing two-dimensional histogram images. By treating the 2D histogram as an image and applying 2D digital image processing techniques (including 2D filtering, edge detection, and contour analysis), the method captures spatial relationships between particle populations that 1D analysis cannot detect, thereby improving segmentation precision for overlapping populations.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent replaces conventional mechanical histogram analysis algorithms with 2D digital image processing techniques. This substitution enables the use of powerful image processing tools (such as 2D Gaussian filtering, Canny edge detection, and contour following algorithms) to automatically identify and segment particle populations, significantly improving measurement precision while managing complexity through standardized image processing workflows.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If 2D digital image processing techniques are applied to segment overlapping populations, then segmentation precision improves, but computational complexity increases

Engineering Contradiction:
Improvesegmentation precisionVSAvoidcomputational complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent implements a multi-stage segmentation process that divides the complex task of 2D histogram analysis into distinct steps: 2D filtering to reduce noise, edge detection to identify population boundaries, contour following to trace population shapes, and region labeling to classify segments. This segmentation of the processing workflow manages computational complexity by breaking down the problem into manageable stages while maintaining high segmentation precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies 2D filtering operations (such as Gaussian filtering) as preliminary steps before edge detection and contour analysis. This preliminary action reduces noise and smooths the 2D histogram data, making subsequent edge detection more reliable and reducing the computational burden of later processing stages by eliminating the need to handle noisy data.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If conventional 1D histogram analysis is used, then computational resources are conserved, but the ability to detect overlapping populations deteriorates

Engineering Contradiction:
Improvedetection reliabilityVSAvoidcomputational resource consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent employs two-dimensional histogram analysis instead of one-dimensional analysis, enabling the detection of spatial relationships and overlaps between particle populations that 1D methods cannot identify. By processing the histogram as a 2D image and applying techniques such as 2D edge detection and contour analysis, the system reliably detects overlapping populations while utilizing computational resources efficiently through optimized image processing algorithms.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentEP2352985B1Non-linear histogram segmentation for particle analysis
Publication Date: 2022.03.16 BECKMAN COULTER INC
  • EP2352985B1 patent drawingFigure 1A~1B
  • EP2352985B1 patent drawingFigure 2A~2B
  • EP2352985B1 patent drawingFigure 3A~3B

AI summary

Systems and methods for non-linear histogram segmentation for particle analysis are provided. In one embodiment, a method for analyzing particles comprises creating an initial two- dimensional histogram based on two selected parameters of the particles, filtering the initial two- dimensional histogram to generate a filtered two-dimensional image, detecting a plurality of seed populations in the filtered two-dimensional image, generating one or more linear contour lines, each having a plurality of contour points, to separate the detected seed populations, and adjusting the contour points in at least one of the linear contour lines to separate the detected seed populations.