Nonlinear Measurement Error Correction via Phase Amplitude Calibration
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Solution Overview
Problem
Current Vector Network Analyzers (VNAs) are insufficient in accurately measuring nonlinear behavior of devices under test, particularly due to limitations in absolute amplitude and cross-frequency phase measurement, which hinders precise nonlinear behavior modeling and simulation.
Innovation Solution
The method involves performing relative and absolute error correction using vector error correction devices, amplitude calibration devices, and phase calibration devices to accurately measure and correct voltage waves, enabling the conversion of nonlinear frequency domain measurements to time domain representations and determining group delay measurements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional vector error correction is used to correct systematic errors in VNA measurements, then measurement accuracy for linear systems is improved, but the ability to accurately measure nonlinear behavior is insufficient
Solution Approach 1:
The error correction process is divided into two distinct segments: relative error correction (using vector error correction for linear systematic errors) and absolute error correction (for amplitude and phase). This segmentation allows each segment to address specific types of errors independently, enabling both linear and nonlinear measurement accuracy without compromising either capability.
Solution Approach 2:
The patent extends the traditional two-dimensional error correction (magnitude only) to a three-dimensional approach by adding phase correction as a separate dimension. By correcting amplitude and phase errors independently through absolute error correction, the system achieves comprehensive error compensation that enables accurate nonlinear behavior measurement while maintaining linear measurement precision.
2Measurement precision
If absolute error correction is performed to accurately measure amplitude and phase, then nonlinear behavior measurement accuracy is improved, but device complexity increases
Solution Approach 1:
The calibration system is designed with multi-functionality to reduce overall complexity. The same measurement infrastructure is used for both relative and absolute error correction, and the calibration process simultaneously characterizes both amplitude and phase errors. This universal approach allows a single calibration routine to address multiple error types without requiring separate dedicated systems for each correction type.
Solution Approach 2:
The system performs self-calibration by automatically determining and correcting its own amplitude and phase errors through the absolute error correction process. The measurement system uses its own resources and capabilities to characterize and compensate for systematic errors, eliminating the need for external calibration equipment or manual adjustment procedures, thereby reducing operational complexity.
3Measurement precision
If comprehensive error correction is applied to all frequency components, then measurement accuracy is improved, but measurement time increases
Solution Approach 1:
The system performs error correction in advance through a calibration phase that characterizes the systematic errors before actual measurements are taken. By pre-determining the amplitude and phase error terms during calibration, the correction factors are established beforehand and can be rapidly applied to subsequent measurements across all frequency components, avoiding the need for time-consuming real-time correction during the actual measurement process.
Data Source
AI summary
A method for eliminating the systematic measurement errors from a measurement system, for example a vector network analyzer, such that an accurate representation of the behavior of a nonlinear device can be measured or characterized. The cross-frequency phase and absolute amplitude of the measured voltage waves applied to and emanating from the nonlinear device are measured and error corrected. These waves may be used for nonlinear device characterization or modeling.