Nonlinear Optical Property Measurement via Phase Shift Detection

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Solution Overview

Problem

Existing methods for measuring nonlinear properties of optical devices and fibers are complex, costly, and prone to errors due to chromatic dispersion and polarization-mode dispersion, particularly when attempting to characterize short optical pulses or require high-resolution optical spectrum analyzers.

Innovation Solution

A method involving the measurement of electric field samples before and after propagation through a device under test, determining nonlinear properties by analyzing the phase and intensity differences, and using linear optical sampling to calculate nonlinear parameters such as self-phase modulation (SPM) and cross-phase modulation (XPM) coefficients.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If short optical pulses are used to measure nonlinear effects, then measurement capability is improved, but chromatic dispersion and polarization-mode dispersion complicate the analysis

Engineering Contradiction:
Improvenonlinear effect measurement capabilityVSAvoidanalysis complexity due to dispersion effects
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts and measures only the phase component of the optical signal while ignoring intensity variations caused by dispersion. By using phase-sensitive detection methods, the system separates the nonlinear phase shift measurement from the intensity distortions introduced by chromatic and polarization-mode dispersion, thereby simplifying the analysis while maintaining measurement accuracy.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent introduces an intermediary reference signal that is coherent with the optical carrier but does not experience the same dispersion effects. This reference signal serves as a mediator to directly measure the phase shift without being affected by chromatic or polarization-mode dispersion, enabling accurate nonlinear coefficient measurement without complex dispersion compensation.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If two CW lasers with very close wavelengths are used to avoid dispersion effects, then measurement accuracy is improved, but costly high-resolution optical spectrum analyzers are required

Engineering Contradiction:
Improvenonlinear coefficient measurement accuracyVSAvoidcostly high-resolution optical spectrum analyzer
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical/optical scanning approach of high-resolution spectrum analyzers with an electronic phase detection system. By using phase-sensitive detection and coherent mixing techniques, the system measures frequency shifts and nonlinear coefficients through electrical signal processing rather than optical spectrum analysis, eliminating the need for expensive high-resolution optical spectrum analyzers.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the measurement parameter from optical intensity/spectrum analysis to phase detection. By measuring the phase shift of the optical signal instead of analyzing its spectrum, the system achieves accurate nonlinear coefficient measurement using standard phase detectors rather than expensive high-resolution optical spectrum analyzers.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If indirect determination methods are used to measure nonlinear refractive index, then measurement capability is improved, but errors are difficult to track

Engineering Contradiction:
Improvenonlinear refractive index measurement capabilityVSAvoiderror tracking difficulty
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent implements a feedback mechanism where the measured phase shift is directly related to the nonlinear coefficient through a known relationship. By continuously monitoring the phase shift and using the established phase-intensity relationship in nonlinear optics, the system provides direct feedback to calculate the nonlinear refractive index, making error sources identifiable and trackable rather than hidden in indirect determinations.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent segments the measurement process into distinct, independently verifiable steps: measuring input intensity, measuring output phase shift, and calculating the nonlinear coefficient. This segmentation allows each measurement step to be independently calibrated and verified, making error sources identifiable and trackable rather than embedded in a single indirect measurement.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for direct and accurate measurement of nonlinear properties without the need for costly equipment, reducing errors and complexity by relying on direct phase shift measurements, and can be applied to various modulation frequencies and bandwidths.

Implementation Method 1

SPM and XPM effects correspond to an induced temporal phase that is related to the temporal intensity of the pulses themselves (in the case of SPM)

Methodology Applied
Scientific EffectSelf-phase modulation (SPM):

Implementation Method 2

cross-phase modulation (XPM) are known to be limiting factors in long-haul optical networks. SPM and XPM effects correspond to an induced temporal phase that is related to the temporal intensity of another optical source

Methodology Applied
Scientific EffectCross-phase modulation (XPM):

Implementation Method 3

the comparison of the temporal phase before and after propagation can be used to determine a measurement of the nonlinear coefficient of the device

Methodology Applied
Scientific EffectPhase shift measurement:

Data Source

PatentUS7385706B2Method and apparatus for determining the nonlinear properties of devices and fibers
Publication Date: 2008.06.10 NOKIA OF AMERICA CORP
  • US7385706B2 patent drawing
  • US7385706B2 patent drawing
  • US7385706B2 patent drawing

AI summary

A method and apparatus are provided for measuring samples of the electric field of light propagated through a device under test and determining a nonlinear property of the device, such as self-phase modulation or cross phase modulation, using the measured samples.