Nonlinear Signal-to-Noise Ratio Measurement in Optical Systems

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Solution Overview

Problem

Current methods for measuring nonlinear signal-to-noise ratio in optical communication systems are inaccurate due to the breaking of internal symbol structures during notch operations, especially at high baud rates and modulation formats, and require costly high-speed ADCs or digital oscilloscopes.

Innovation Solution

An apparatus and method that perform notch operations on input signals in the symbol or bit domain before passing through a nonlinear system, allowing for accurate estimation of nonlinear signal-to-noise ratio without disrupting internal structures, using a processing unit, measuring unit, and estimating unit to analyze the output signal's spectrum.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If notch operation is performed on waveform domain before nonlinearity occurs, then nonlinear signal-to-noise ratio can be obtained, but internal structures of symbols are broken and measurement accuracy deteriorates

Engineering Contradiction:
Improvenonlinear signal-to-noise ratio measurement accuracyVSAvoidsymbol internal structure integrity
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent applies preliminary action by performing the notch operation after the signal has passed through the nonlinear system, rather than before. This timing ensures that the symbol internal structures are already formed and preserved, while still allowing accurate measurement of nonlinear noise characteristics. The key insight is that performing the spectral notch operation at this later stage does not disrupt the symbol structures that have already been established by the pulse shaping filter.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If high-speed ADC or digital oscilloscope is equipped to obtain time domain waveform, then orthogonal component can accurately describe nonlinear performance, but cost increases and practical implementation becomes difficult

Engineering Contradiction:
Improvenonlinear performance description accuracyVSAvoidtest equipment requirements
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts only the essential spectral information needed for nonlinear noise measurement, rather than requiring complete time-domain waveform capture. By performing spectral analysis and notch operations directly on the received signal in the frequency domain, the method isolates and measures only the nonlinear noise components without needing high-speed ADCs or digital oscilloscopes. This extraction approach maintains measurement accuracy while dramatically reducing equipment complexity and cost.

Inventive Principle:
Principle #2Taking out (Extraction)

3Ease of manufacture

If conventional notch operation is performed before pulse shaping, then nonlinear estimation can be obtained, but pulse shaping effects are not considered and estimation accuracy deteriorates

Engineering Contradiction:
Improvemeasurement method simplicityVSAvoidnonlinear noise estimation accuracy
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent reverses the conventional sequence by performing the notch operation after pulse shaping has already occurred. This ensures that the pulse shaping effects are fully incorporated into the signal before nonlinear noise measurement, allowing for accurate estimation that accounts for the actual signal characteristics including pulse shaping. The method maintains simplicity by using standard spectral analysis techniques while improving accuracy through proper sequencing.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11881906B2Apparatus and method for measuring nonlinear signal-to-noise ratio, and test instrument
Publication Date: 2024.01.23 FUJITSU LTD
  • US11881906B2 patent drawing
  • US11881906B2 patent drawing
  • US11881906B2 patent drawing

AI summary

The present disclosure provides an apparatus and method for measuring a nonlinear signal-to-noise ratio, and a test instrument. The method for measuring a nonlinear signal-to-noise ratio may include performing notch operation on at least one frequency point in a spectrum of an input signal in a symbol domain or a bit domain; performing spectrum measurement on an output signal after passing through a nonlinear system; and estimating a nonlinear signal-to-noise ratio of at least one frequency point of the nonlinear system according to a spectrum of the output signal. According to the embodiments of the present disclosure, when the notch operation is performed, internal structures of symbols or bits of the input signal may be retained, and an accuracy of the measurement of the nonlinear signal-to-noise ratio may be improved.