Non-linear System Characterization via Multi-pattern Impulse Responses
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Solution Overview
Problem
Existing techniques for characterizing non-linear electronic systems are inadequate, as they rely on single step responses, which are insufficient for capturing the complexity of these systems, leading to accuracy issues and limited characterization capabilities.
Innovation Solution
A computer-implemented method that identifies non-linear systems by determining the severity of non-linearity, using either a single random input pattern for low severity or multiple pattern-dependent impulse response characterizations for high severity systems, which are then used to generate channel simulation waveforms and applied to algorithmic modeling interfaces for enhanced system analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single step response is used for system characterization, then the method is simple and works for linear time invariant systems, but the accuracy is insufficient for complex non-linear systems
Solution Approach 1:
The patent segments the characterization process by dividing the input signal into multiple distinct patterns (e.g., rising edge, falling edge, and intermediate patterns) and deriving separate impulse response characterizations for each pattern. This segmentation allows the system to capture different aspects of non-linear behavior that a single step response cannot represent, thereby improving measurement precision for non-linear systems.
Solution Approach 2:
The patent applies dynamics by transitioning from a static single step response approach to a dynamic multi-pattern approach. The system adapts the characterization method based on the detected degree of non-linearity, selecting between single and multiple impulse responses dynamically. This dynamic adaptation improves accuracy for non-linear systems while managing complexity through automated selection.
2Measurement precision
If multiple pattern-dependent impulse response characterizations are derived for high severity non-linear systems, then the characterization accuracy is improved, but the computational complexity and processing time increase
Solution Approach 1:
The patent applies preliminary action by first determining the degree of severity of non-linearity before committing to a full multi-pattern characterization process. This preliminary assessment allows the system to avoid unnecessary computational overhead for systems with low non-linearity, thereby reducing processing time while still ensuring accurate characterization when needed.
Solution Approach 2:
The patent changes the parameter of characterization complexity based on the detected degree of non-linearity. For low severity cases, a single impulse response is used; for high severity cases, multiple pattern-dependent impulse responses are derived. This parameter adaptation balances accuracy requirements with processing time constraints by adjusting the level of characterization detail to match the actual system complexity.
Data Source
AI summary
The present disclosure relates to non-linear systems associated with an electronic circuit design. Embodiments may include identifying the non-linear system associated with the electronic circuit design and determining a degree of severity of non-linearity of the non-linear system associated with the electronic circuit design. If the degree of severity is less than a predefined threshold, embodiments may further include receiving a random input pattern and deriving a single impulse response characterization, wherein the random input pattern is based upon, at least in part, an electronic circuit simulation associated with the electronic circuit design.