Nonvolatile Memory Erase Control via Pulsed Voltage

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Solution Overview

Problem

The existing flash memory devices face issues with the fast program phenomenon and slow erase phenomenon due to increased voltage differences between the word line and the bulk, leading to inefficient erase operations and reduced data storage capacity.

Innovation Solution

A nonvolatile memory device with a bias voltage generator and bulk voltage generator that control the voltage levels and pulse widths during erase operations to maintain an optimal voltage difference, allowing for additional erase operations if necessary, thereby preventing the fast program and slow erase phenomena.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If a high voltage difference is applied between the word line and bulk during erase operation, then the erase speed is improved, but the fast program phenomenon and slow erase phenomenon occur leading to reduced reliability

Engineering Contradiction:
Improveerase speedVSAvoiddata storage reliability
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent applies periodic pulsed voltage differences during the erase operation instead of continuous high voltage. The control circuit generates periodic pulse signals that alternately apply high voltage difference (for rapid electron discharge) and low voltage difference (to prevent fast program phenomenon). This periodic action allows the system to achieve fast erase speeds while avoiding the harmful effects of sustained high voltage differences, thereby maintaining data storage reliability.

Inventive Principle:
Principle #19Periodic action

2Reliability

If repeated erase operations are performed with high voltage difference, then the initial erase effectiveness is maintained, but invalid blocks are generated reducing data storage capacity

Engineering Contradiction:
Improveerase operation effectivenessVSAvoiddata storage capacity
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The patent dynamically adjusts the voltage difference applied during erase operations based on the operational history of memory blocks. The control circuit monitors the number of erase cycles and automatically modulates the voltage amplitude and pulse width. For blocks requiring repeated erasure, the system applies dynamically adjusted pulsed voltages that maintain erase effectiveness while preventing the accumulation of damage that leads to invalid block formation, thus preserving data storage capacity.

Inventive Principle:
Principle #15Dynamics

3Reliability

If high voltage difference is continuously applied during erase operation, then the erase completeness is improved, but the operation time increases due to slow erase phenomenon

Engineering Contradiction:
Improveerase completenessVSAvoiderase operation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent employs periodic pulsed voltage application where high voltage difference pulses are interspersed with low voltage intervals. During high voltage pulses, electrons are rapidly discharged from floating gates achieving complete erasure. During low voltage intervals, the system prevents slow erase phenomenon from occurring. This periodic modulation achieves both erase completeness and time efficiency by concentrating the erosive action into brief high-voltage pulses rather than sustained application.

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS8576635B2Nonvolatile memory device and method of operating the same
Publication Date: 2013.11.05 SK HYNIX INC
  • US8576635B2 patent drawing
  • US8576635B2 patent drawing
  • US8576635B2 patent drawing

AI summary

A nonvolatile memory device includes memory cell blocks each configured to comprise memory cells erased by an erase voltage, supplied to a word line, and a bulk voltage supplied to a bulk, a bias voltage generator configured to generate a first erase voltage, having a first pulse width and a first amplitude, in order to perform the erase operation of the memory cells and a second erase voltage, having a second pulse width narrower than the first pulse width and a second amplitude lower than the first amplitude, in order to perform an additional erase operation if an unerased memory cell is detected after the erase operation is performed, and a bulk voltage generator configured to generate the bulk voltage.