Nonvolatile Memory Open Word Line Closure

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Solution Overview

Problem

Non-volatile memory devices, such as EEPROM, face challenges in efficiently managing open word lines during programming operations, which can lead to data reliability issues due to insufficient coupling and increased error probabilities.

Innovation Solution

A memory system comprising a non-volatile memory device with a memory controller that identifies open word lines in second memory blocks and closes them by performing a 3-step program operation on adjacent upper word lines, using data from first memory blocks or random data to ensure valid data storage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If programming operations are performed on second memory blocks, then data storage capacity is improved, but open word lines are generated causing data reliability to deteriorate

Engineering Contradiction:
Improvedata storage capacityVSAvoiddata reliability
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent applies preliminary action by performing a reprogram operation on an upper word line immediately adjacent to the open word line before finalizing the programming of the second memory block. This preliminary reprogram operation closes the open word line by programming memory cells on the adjacent upper word line, preventing potential data reliability issues before they can manifest during subsequent read or write operations.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If reprogram operation is performed on upper word lines to close open word lines, then data reliability is improved, but programming time increases

Engineering Contradiction:
Improvedata reliabilityVSAvoidprogramming time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies partial action by performing the reprogram operation only on the specific upper word line immediately adjacent to the open word line, rather than reprogramming all word lines in the memory block. This targeted approach closes the problematic open word line while minimizing the additional programming time required, avoiding unnecessary reprogram operations on other word lines that do not have open line issues.

Inventive Principle:
Principle #16Partial or excessive action

3Reliability

If random data or data from first memory blocks is used for reprogram operation, then open word lines are closed, but data management complexity increases

Engineering Contradiction:
Improvedata integrityVSAvoiddata management complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies self-service by utilizing data from the first memory blocks (which store m-bit data) to perform the reprogram operation on the second memory block. The memory system uses its own existing data resources internally, eliminating the need for external data sources or complex data management protocols. The first memory blocks serve themselves by providing the data needed to close open word lines in the second memory blocks.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS9183938B2Nonvolatile memory device and method of programming nonvolatile memory device
Publication Date: 2015.11.10 SAMSUNG ELECTRONICS CO LTD
  • US9183938B2 patent drawing
  • US9183938B2 patent drawing
  • US9183938B2 patent drawing

AI summary

A memory system includes a nonvolatile memory device and a memory controller. The nonvolatile memory device includes first memory blocks configured to store m-bit data per cell and second memory blocks configured to store n-bit data per cell. The memory controller is configured to control the nonvolatile memory device to close an open word line generated in a second memory block of the second memory blocks when a program operation is performed on the second memory block.