Nonvolatile Memory Sub-Processor for Parallel Program Verification

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Solution Overview

Problem

Existing nonvolatile memory devices require prolonged time for program operations due to sequential performance of program voltage apply and verify operations, which can be optimized for faster processing.

Innovation Solution

A memory device with a sub-processor that controls parallel execution of program-related voltage application and pass/fail check operations, alongside a main processor managing overall control, allowing simultaneous execution of these tasks.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If program voltage apply operation and verify operation are performed sequentially, then reliability of data storage is ensured, but time required for program operation is lengthened

Engineering Contradiction:
Improvereliability of data storageVSAvoidtime required for program operation
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The control logic is segmented into a main processor for voltage control and a sub-processor for pass/fail check operations. This segmentation allows the verify operation to be performed in parallel with the program voltage apply operation, reducing the total time while maintaining reliability through separate dedicated control paths for each function.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a temporal dimension by enabling parallel execution of program voltage apply and verify operations through dual processor architecture. The main processor handles voltage application while the sub-processor simultaneously performs verify operations, transforming a sequential one-dimensional process into a parallel multi-dimensional execution model.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Ease of operation

If program voltage apply operation and verify operation are performed sequentially, then control simplicity is maintained, but productivity of memory device is reduced

Engineering Contradiction:
Improvecontrol simplicityVSAvoidproductivity of memory device
Core Design Contradiction:
Ease of operationVSProductivity

Solution Approach 1:

The control function is divided into two independent processors: a main processor for voltage control and a sub-processor for verify operations. This segmentation enables parallel execution, improving productivity from 100% sequential to approximately 50% parallel efficiency, while each processor maintains simple dedicated control logic.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The dual processor architecture provides multi-functionality where the main processor handles voltage control and the sub-processor handles verify operations. This universal design allows both functions to execute simultaneously, enhancing productivity without complicating the overall control structure as each processor has a specialized single function.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Device complexity

If single processor controls both voltage application and verify operations, then device complexity is reduced, but time required for program operation increases

Engineering Contradiction:
Improvedevice complexityVSAvoidtime required for program operation
Core Design Contradiction:
Device complexityVSLoss of time

Solution Approach 1:

The control function is divided into two independent processors: a main processor for voltage control and a sub-processor for verify operations. This segmentation enables parallel execution, reducing the total time while maintaining reliability through separate dedicated control paths for each function.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a temporal dimension by enabling parallel execution of program voltage apply and verify operations through dual processor architecture. The main processor handles voltage application while the sub-processor simultaneously performs verify operations, transforming a sequential one-dimensional process into a parallel multi-dimensional execution model.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS12451202B2Memory device with sub-processor for parallel control of program voltage and pass/fail check and method of operating the same
Publication Date: 2025.10.21 SK HYNIX INC
  • US12451202B2 patent drawing
  • US12451202B2 patent drawing
  • US12451202B2 patent drawing

AI summary

Provided herein is a memory device and a method of operating the same. The memory device includes memory cells coupled between a word line and bit lines, a main processor configured to control program-related voltages that are applied to the word line and the bit lines, a page buffer configured to store data sensed based on threshold voltages of the memory cells, a sensing circuit configured to perform a pass/fail check operation of comparing a sensing current corresponding to the sensed data with a reference current, and a sub-processor configured to control the page buffer and the sensing circuit to perform the pass/fail check operation in parallel with control of the program-related voltages while the main processor controls the program-related voltages.