Nonvolatile Memory Temperature Recording via Segmented Storage
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Solution Overview
Problem
Nonvolatile memory systems, such as NAND flash memory, face challenges in accurately recording and managing operating temperatures during data writing, leading to potential errors due to temperature fluctuations between writing and reading operations, which can result in increased error bits and difficulty in correcting threshold voltage shifts.
Innovation Solution
Incorporating a built-in temperature sensor to record temperature information in a dedicated area of the memory array separate from user data, allowing for precise temperature management and correction during data writing, using a control circuit to write temperature data alongside user data and employing error correction mechanisms to handle temperature-related errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If temperature information is recorded in the same memory area as user data, then storage efficiency is improved, but data integrity and reliability deteriorate due to temperature-related errors
Solution Approach 1:
The memory array is divided into distinct regions: a first region for storing user data and a second region for storing temperature information. This segmentation isolates temperature-related data from user data, preventing temperature fluctuations from affecting user data integrity while maintaining efficient storage utilization.
2Measurement precision
If temperature sensor is integrated into the nonvolatile memory, then temperature measurement precision is improved, but device complexity increases
Solution Approach 1:
The temperature sensor is integrated directly into the nonvolatile memory device, combining temperature measurement functionality with data storage. This integration enables precise temperature monitoring at the memory location while avoiding the complexity of external sensor connections and data synchronization mechanisms.
3Reliability
If error correction mechanisms are added to handle temperature-related errors, then data reliability is improved, but device complexity increases
Solution Approach 1:
The system uses feedback from the temperature sensor to dynamically adjust error correction strategies. When temperature fluctuations are detected, the control circuit activates enhanced error correction mechanisms for data in the first region, while using simpler methods for temperature data in the second region, optimizing reliability without excessive complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate temperature recording and management at the time of writing, reducing errors and improving data retention reliability by ensuring that temperature information is properly recorded and used for correction, even in cases of significant temperature differences between writing and reading.
Implementation Method 1
a sensor for measuring a temperature
Data Source
AI summary
A nonvolatile memory includes a memory array, a sensor for measuring a temperature, an interface through which a write command is to be received, and a control circuit. The control circuit is configured to write information of the temperature measured by the sensor in a data storing area of the memory array in which user data associated with the write command is not capable of being written into, when writing the user data in the memory array in response to the received write command.