Nonvolatile Memory Read Voltage Adjustment via Time-Read Level Look-Up Table
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Solution Overview
Problem
Existing storage devices with nonvolatile memory struggle with data retention reliability due to fixed read voltage settings, which do not account for temperature variations, program elapsed time, and memory cell deterioration, leading to uncorrectable errors.
Innovation Solution
A read method that adjusts the time-read level look-up table based on a valley search operation, considering temperature, program elapsed time, and memory cell deterioration, using a memory controller to set optimal read voltages and perform error correction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If fixed read voltage settings are used, then device complexity is reduced, but data retention reliability deteriorates due to temperature variations, program elapsed time, and memory cell deterioration
Solution Approach 1:
The patent implements dynamic read voltage adjustment by introducing a time-read level look-up table that stores read level shift values corresponding to different program elapsed times. The memory controller dynamically selects and applies the appropriate read level shift based on the stored program time, enabling the read voltage to adapt to temporal changes in memory characteristics without requiring complex real-time analysis.
Solution Approach 2:
The patent changes the read voltage parameter based on multiple factors including temperature, program elapsed time, and memory cell deterioration. By storing read level shift values in a look-up table and adjusting the read voltage according to these pre-calibrated values, the system maintains data retention reliability under varying conditions without implementing complex real-time control algorithms.
2Reliability
If read voltage is adjusted based on temperature and program elapsed time, then data retention reliability improves, but measurement precision requirements increase
Solution Approach 1:
The patent performs preliminary characterization of memory cell behavior under different temperatures and program elapsed times, storing the read level shift values in a look-up table before normal operation. This pre-characterization approach eliminates the need for complex real-time measurements during read operations, as the system simply retrieves pre-determined correction values based on temperature and time parameters.
Solution Approach 2:
The patent implements a feedback mechanism where the memory controller monitors read operation results and adjusts the read level shift values in the look-up table based on detected errors or performance degradation. This feedback loop ensures that the measurement precision requirements are maintained while continuously improving data retention reliability under varying operating conditions.
3Measurement precision
If valley search operation is performed to adjust time-read level look-up table, then read operation accuracy improves, but operation time increases
Solution Approach 1:
The patent performs the computationally intensive valley search operation periodically or at predetermined intervals rather than for every read operation. The look-up table is updated at these periodic intervals to reflect current memory characteristics, while normal read operations simply retrieve pre-calculated values. This approach maintains high read operation accuracy while minimizing the time penalty associated with valley search operations.
Solution Approach 2:
The patent applies partial valley search by performing the operation on selected memory blocks or pages rather than the entire memory array. This selective approach maintains read operation accuracy for critical data while reducing the overall time consumption by limiting the scope of valley search operations to only those areas where it is most beneficial.
Data Source
AI summary
A read method of a storage device includes performing a first read operation on a nonvolatile memory device based on a time stamp table storing a program time and a time-read level look-up table indicating a read level shift due to a program lapsed time. A determination is made whether to adjust the time-read level look-up table based on a result of the first read operation. As a consequence of determining to adjust the time-read level look-up table, adjusting the time-read level look-up table through a valley search operation and performing a second read operation on the nonvolatile memory device based on the time stamp table and the adjusted time-read level look-up table.


